Hi,

For testing USB HCD driver ,  there is a kernel mode driver
"usbtest.c" , which comprises of 16 different tests.

I could get the first 2 tests.

Test 1 - Simple non-queued bulk "Sink" (IN) I/O tests
Test 2 - Simple non-queued bulk "Source" (OUT) I/O tests

How does the Test 3 and Test 4 work.? Please tell how the "vary"
paramter helps. Is it to vary the transfer_buffer_length in URB , in
each iteration.by the number specified in parameter "vary".

Can u please explain the use of "Scatter-Gather list". What i
understand is that the URB->transfer_bufffer is divided in to a
scatter list , which are pointers to buffer. This is "Scatter Gather
DMA ", but the DMA controller should be supporting this.

Can u please point out , how can a EHCI -HCD driver be divided into
various modules .. like IRQ Handling, URB QUEING... ETC  .

Which modules in ehci-hcd does the above test affect.

Thanks
RAK


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