https://github.com/JDevlieghere approved this pull request.

LGTM.

I wonder though if there's something better we can do here. IIUC, if you don't 
have DIA enabled, these tests will basically run the same test twice (both 
using the NativePDB reader). It would be nice if we could avoid that, and run 
the same test once (NativePDB) or twice (DIA + NativePDB) that doesn't involve 
duplicating all the lines. 

https://github.com/llvm/llvm-project/pull/152580
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