Dear All, I am trying to write material code for a thin layer of silicon to try to simulate the optical properties of the structure I have built practically. The problem is that the Meep transmission and reflectance results, although they follow a similar trend to those exhibited by the silicon sample, show excessive fringes.
I think the refractive index of the sample (about 3.0) is not the same as standard silicon (3.5) and this could be a reason for the discrepancies. Could anyone please advise me on how I could obtain the omega, gamma and delta-epsilon values for my sample? If I had the n and k values (real and imaginary components of the refractive index), I could potentially obtain the dielectric function from these and adjust this to fit the dispersive material model in Meep. Would this be a valid approach? Any advice would be greatly appreciated, Thanks. ================================================= Email has been scanned for spam and viruses by Altman Technologies' email management service The LSBU communications disclaimer can be found at http://www.lsbu.ac.uk/ict/legal/ _______________________________________________ meep-discuss mailing list [email protected] http://ab-initio.mit.edu/cgi-bin/mailman/listinfo/meep-discuss
