Hi--- I am curious about modifying the analytical forms of dispersive dielectric materials in MEEP. I have been trying to fit the optical dielectric functions of Si to Lorentz and Drude lineshapes (as encapsulated in MEEP) with little success. (As an aside, if you allow the parameters to be complex, you can make excellent fits to the data with a single Lorentzian oscillator. It isn't possible with <5 oscillators with real parameters).
Deinga and John (Optics Letters, 37, 112 (2012)) have shown recently that if you modify the Lorentz susceptibility to have an additional term in the numerator that is proportional to omega, you can make excellent fits to the data. My question is: how difficult would it be to implement this form in MEEP? Is it possible? Alternatively, if a good model for Si is known in the MEEP community that utilizes the built-in functions, could someone pass along a reference? Thanks, Rob
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