On Mon, 4 May 2020 at 21:57, Matthew Petach <[email protected]> wrote:
> As the process size in fabrication gets smaller and smaller, it takes less > and less energy hitting a device to cause spurious events like these. Agreed. However in this case it was not a single-event upset (or multi-event upset) but timing problem, fixable with new software on the memory controller. Single-event upsets should be benign with ECC memories. -- ++ytti
