On Tue, 16 Dec 2025 at 10:57, Robert Yang via lists.openembedded.org <[email protected]> wrote: > The 6.17 has 27 failed test cases, and 6.18 only has 2 failed ones: > FAIL: bpf.gen.test > FAIL: bpf-v.gen.test
This needs a bit more context. If the old version had failures, and the new version still has failures, why aren't they seen in testing? Where and how do they happen? Should they be fixed rather? Alex
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