On Thu, 8 Oct 2026 at 20:22, Jaipaul Cheernam via lists.openembedded.org <[email protected]> wrote:
> - Extend the ptest-runner timeout to 1800s on riscv32/riscv64 for the new > slow TestConcurrentTee.test_concurrent_consumers. > > qemux86-64 PASS 18s > qemux86-64-musl PASS 19s > qemuarm64-musl PASS 27s > qemuarm64 PASS 28s > qemuriscv64 PASS 1654s > qemuriscv32 PASS 1702s > > Signed-off-by: Jaipaul Cheernam <[email protected]> > --- > Changes since v1: > - TestConcurrentTee.test_concurrent_consumers test is test spins up 100 > threads, > each fully consuming an independent tee of a 100,000-element > iterator, with locking/synchronization between them. > This values are hard coded, so either test case needs to deselect or > timeout needs to increase. > So, I choose to increase timeout for riscv64/riscv32 rather than > deslect. > The consensus in the patch review was that a nearly 100x time increase in TCG vs. real silicon is still pathological and needs to be investigated (assuming all targets run exact same test code). So can you look into that, perhaps with guidance from Trevor (or maybe Trevor can also check what is happening)? Also a 1800s timeout when the test takes 1702s is too close, and that can easily go over on loaded autobuilder machines. For reliability, it would need to be at least double what you observe. But if we don't make progress with figuring out the slowness, we should probably disable the specific slow test, rather than let it run for 30 minutes. Alex
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