Dallas had an issue with 18B20, 18S20, 18B20-PAR, and 18S20-PAR devices, known famously as the "C3" Die problem, some time ago. It is characterized, as I am told, by repeated 85C readings returned from the device caused by a failure of the chip to properly POR. The fix involves issuing an "exit from test mode" command prior to a conversion.
Reset issue ROM Command (Skip, Match) issue 0x64 I haven't seen this problem in new stock so perhaps the best fix is to replace the device in question. However I do cover this in my software and perhaps 1WFS might, too. /m Paul Alfille wrote: > 85 (the AA00 bit pattern) is apparently one of the error modes of the > chip. We repeat the measurement if it occurs. Then return the value (it > COULD be correct). I don't know how to improve. Perhaps power issues? > Purely a guess. > > Paul > ------------------------------------------------------------------------- Take Surveys. Earn Cash. Influence the Future of IT Join SourceForge.net's Techsay panel and you'll get the chance to share your opinions on IT & business topics through brief surveys - and earn cash http://www.techsay.com/default.php?page=join.php&p=sourceforge&CID=DEVDEV _______________________________________________ Owfs-developers mailing list [email protected] https://lists.sourceforge.net/lists/listinfo/owfs-developers
