On 9 Mar 2004 at 18:48, J. C. O'Connell wrote: > I dont know about your last statement, the higher the density > (smaller the circuits) the more defects will occur in MFG, > and hense lower yield/higher cost for a much denser chip of the > same area.
What was alluding to was that the size of imperfections has been reduced with the development of many other very high density chips, so much so that generally flaws are likely many many time smaller than a pixel site even on a small relatively dense sensor. Yield rates have been improved upon significantly in the last 10 years. http://www.wired.com/wired/archive/4.06/money.html Rob Studdert HURSTVILLE AUSTRALIA Tel +61-2-9554-4110 UTC(GMT) +10 Hours [EMAIL PROTECTED] http://members.ozemail.com.au/~distudio/publications/ Pentax user since 1986, PDMLer since 1998
