Alin wrote:

>   Definitely contrary to my experience. More than half of my slides
>   exposed with multisegment were totally compromised by overexposure.


Thats seem pretty starnge to me. I have no experience with the MZ-5n but my experience 
with multi pattern metering is that it can be considered "right" close to 90% of the 
time. A 50% failure rate seem to be about right for centerweighted metering. 


>   The only problem is that multisegment compensates mainly towards
>   overexposure and rarely does it towards underexposure. If the
>   contrast range is high - more than 4 stops as measured by different
>   segments of the meter, the more likely is that the algorithm will
>   choose to expose for the dark areas.


This may be true for the MZ-5n but not for the 645n and the MZ-S based on preliminary 
results. 


P�l


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