1st International Workshop on Testing Extra-Functional Properties and Quality 
Characteristics of Software Systems (ITEQS)
Co-located with the 10th IEEE International Conference on Software Testing, 
Verification and Validation (ICST 2017), Tokyo - Japan


The rapid development towards increased integration of software with the social 
and physical world that we see today means that quality aspects such as 
performance, safety, security, and robustness become more important in an 
increasing number of the systems and devices, which we use and depend on. In 
this context, the success of a software product may not only depend on the 
logical correctness of its functions, but also on the system quality 
characteristics. Such system characteristics, which are referred to and 
captured as Extra-Functional Properties (EFPs) or Non-Functional Properties, 
are particularly important in resource constrained systems such as in the 
domains of real-time embedded and cyber-physical systems. Therefore, such 
systems need to be tested with a special attention to the EFPs. Testing EFPs is 
challenging and often requires different approaches compared to testing normal 
functionality. ITEQS provides a focused forum with the goal of bringing 
together researchers and practitioners to share ideas, identify challenges, 
propose solutions and techniques, and in general expand the state of the art in 
testing EFPs and quality characteristics of software systems and services. The 
workshop endorses contributions in a wide range of topics related to testing of 
EFPs in the form of full papers and short yet solid work-in-progress/position 

Note: The workshop does not accept papers that focus purely on functional 

    - Model-based testing of EFPs; e.g., choice of modeling languages to 
capture EFPs and their role on testability, model-based test case generation, 
    - Mutation-based testing for EFPs; e.g., application of mutation techniques 
for testing of EFPs particularly introduction of EFP-specific mutation operators
    - Search-based testing techniques for EFPs
    - Testability, observability, controllability and the role of the platform; 
e.g., how the choice of operating system can impact testability of EFPs, for 
instance, a real-time operating system, introducing testability mechanisms into 
a platform, designing - middlewares for testing of EFPs
    - Empirical studies and experience reports; e.g., on the importance of 
testing EFPs, evaluation of testing methods, case-study and reports on project 
failures due to EFPs, comparison of methods and techniques
    - Quality assurance, standards, and their impact on testing EFPs
    - Requirements and testing EFPs; e.g., identification and generation of 
test oracles for EFPs from requirements, requirements for testability, 
    - Coverage criteria in testing EFPs
    - Processes and their role in testing EFPs; e.g., agile and TDD
    - Fault localization for EFPs and debugging
    - Formal methods, model-checking, and reasoning about EFPs
    - Parallelism, Concurrency, and Testing of multicore applications
    - Performance, Robustness, and Security Testing
    - Testing real-time, embedded, and cyber-physical systems, and their 
    - Testing quality characteristics of distributed, mobile, and cloud 

Paper format: 1) full papers 6-8 pages,  2) solid work-in-progress and position 
papers 4 pages; in IEEE double column format.
Submission site:
Accepted papers will be published in IEEE Digital Library.

Submission deadline: December 1, 2016
Notifications: January 2, 2017
Workshop date: March 12, 2017 (preliminary)

Mehrdad Saadatmand, SICS Swedish ICT, Västerås, Sweden (
Birgitta Lindström, University of Skövde, Sweden (
Markus Bohlin, SICS Swedish ICT, Västerås, Sweden (

Antonia Bertolino, CNR (National Research Council), Italy
Mark Harman, University College London, UK
Vahid Garousi, Hacettepe University, Turkey
Jeff Offutt, George Mason University, USA
James H. Hill, Indiana University-Purdue University Indianapolis, USA
Vittorio Cortellessa, University of L'Aquila, Italy
Mohammad Mousavi, Halmstad University, Sweden
Brian Nielsen, Aalborg University, Denmark
Robert Feldt, Blekinge Institute of Technology, Sweden
Shiva Nejati, University of Luxembourg, Luxembourg
Björn Lisper, Mälardalen University, Sweden
Hadi Hemmati, University of Manitoba, Canada
Wasif Afzal, Mälardalen University, Sweden
Tsong Yueh Chen, Swinburne University of Technology, Australia
Pasqualina Potena, SICS Swedish ICT Västerås, Sweden
Bestoun S. Ahmed, IDSIA USI-SUPSI, Switzerland

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