I am working with the Koalariet software. I have presented problems upon
loading an experimental data from a sample (Silicon) with which the
diffractometer was calibrated. Xfit Koalariet display the pattern of this
sample in screen but with all displaced picks; when I analyze statements
values I find that they correspond to a wavelength which was not used in
the mensurements (my pattern was fact with KaCu, Xfit shows the pattern
for a KaCo).
Somebody is able to help me with this apparent problem. Is
maybe that does it have any wavelength introduced by default?, if being
so, where could be changed?. I could say, also, that I have processed
other patterns taken from Xfit in the same diffractometer and I have not
this problem before.
