Hi all rietveld users,
We would like to use the variable slit attached with our diffractometer for
Rietveld refinement. I have read the basic papers on the subject : Modern
Powder Diffraction + the paper by M.E.Bowden et al � Comparison of
intensities from fixed and variable divergence X-ray diffraction experiments
� in Powder Diffraction, Vol 6, No. 2, June 1991 + the few lines in the
Lebail site � low FWHM and Rp� found at
http://pcb4122.univ-lemans.fr/powdif/low_fwhm_and_rp.html.
my questions are :
is there a large discrepancy to the theoretical expression :
IFDS/IVDS=1/sin(theta) ?
then could we simply applied this correction on the data, and then performed
a regular Rietveld refinement with Fullprof or GSAS ?
Is there any comparison beetwen structural data obtained by the both FDS
(Fixed Divergence Slit) and VDS (Variable Divergence Slit) ?
Thanks in advance,
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Dr. Fran�ois Goutenoire
Laboratoire des Fluorures UPRES 6010
Av. Olivier Messiaen 72085 Le Mans Cedex
Tel : 02.43.83.33.53
Fax : 02.43.83.35.06
E-Mail : [EMAIL PROTECTED]
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