At , you wrote:
>Respected Members,
>
>I have some queries regarding X ray diffraction
>analysis and modern
>techniques.
>
>1)can we calculate dislocation density from X ray
>diffraction? If yes please explain in briefly .
>
>2)If we can measure dislocation densities then can we
>quantify by X ray diffraction?
>
Theories by Krivoglaz (Theory of X-ray and thermal neutron scattering by
real crystals, (1969), New-York: Plenum) are linking strain line broadening
to dislocation densities.
Formulas have been derived, for example in the case of the hexagonal
structure (Klimanek and Kuzel, J. Appl. Crystallogr. 21 (1988) 59-66, 21
(1988) 363-368, 22 (1989) 299-307) and applied to the case of
hydrided-dehydrided Pd (cubic) or LaNi5 type materials (hexagonal) (Wu et
al, J. Appl. Crystallogr. 31 (1998) 356-362, 363-368, Cerny and Joubert, J.
Appl. Crystallogr. 33 (2000) 997-1005).
The latter compounds show very high anisotropic line broadening
exclusively due to dislocation density. The analysis allow the
determination of the slip system involved and the measurement of the
dislocation density.
------------------------------------
Jean-Marc Joubert
Chargé de recherche
Laboratoire de Chimie Métallurgique des Terres Rares
CNRS - UPR 209
2 - 8 rue Henri Dunant - 94320 THIAIS Cedex - FRANCE
phone : 33 1 49 78 12 11
fax : 33 1 49 78 12 03
email : [EMAIL PROTECTED]
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