Dear colleages, I have a question about line broadening analysis of XRD peaks. This is as follow:
I have a material which is doped with a reduced percentage (7 to 10 mol per cent) of dopings. Under a given processing condition, TEM indicates that the doping elemensts are not ramdomly distributed within the lattice host, but they group together forming clusters. I would like to know what effects are expected on the peak profiles and why. This is: are lattice microstrains, diffraction domains, residual stresses, and lattice parameters reduced or increased due to doping clustering?. Also, are new peaks corresponding to the clusters expected?. I am not clear now. Thanks in advance. sincerely, Angel L. Ortiz
