Can anyone send me the following paper. Our institute doesn't subscribe the journal....
J. Appl. Cryst. (2004). 37, 629-634 [doi:10.1107/S0021889804013366] Nanocrystalline domain size distributions from powder diffraction data M. Leoni and P. Scardi Abstract: The need for an a priori domain size distribution is one of the main limitations of existing line profile analysis methodologies. A numerical modification of the whole-powder-pattern modelling algorithm is proposed, to allow the refinement of a general domain size distribution from powder diffraction data. The shape of domains has to be inferred for the specimen under study. The algorithm is robust enough to unveil fine details in the refined distribution, as witnessed by the results of tests performed both on simulated and on real patterns of nanocrystalline ceria. Keywords: whole powder pattern modelling; grain size distribution; line profile analysis. +++++++++++++++++++++++++++++++++++++++++++++++++++ M Venkata Kamalakar Junior Research Fellow, S.N.Bose.National Centre for Basic Sciences, Block-JD, Sector-3, Salt Lake, Kolkata, Pin: 700 098. Phone no: 033 23355705/6/7/8 Extn: 404, 104, 301. +++++++++++++++++++++++++++++++++++++++++++++++++++
