Re: profile matching from diffused diffraction pattern

[Andreas Leineweber]

Dear Namsoo Shin, Without knowing the compound and without knowing its history a judgement is difficult. One possibility is that you have a distribution of lattice parameters in your sample, as it can e.g. occur for a composition distribution, where a and c change differently with composition. The mathematics for such a case are dealt with in J. Appl. Cryst. 37 (2004) 123-135. Particularily such asymmetric line broadening is also known (if it applies) for the low temperature phases being the product of a phase transition cubic-tetragonal. This is most probably mainly due to the twinned microstructure with strained crystallites as a result of such a transformation (see e.g. Z. Krist. 220 (2005) 726). A software with which you can program both cases by yourself is Topas, which is however not free of charge. Best regards Andreas Leineweber Namsoo Shin wrote: Dear all,   From highly diffused samples, I got x-ray diffraction patterns show that all hk0 peaks have additinal tails at low angle side and all 00l peaks have tails at high angle side. Could anyone suggests how to handle these patterns? any reference? Is there any good software(profile matching) which can handle such a diffused powder diffraction pattern?   Thanks.   - Namsoo Shin -- Dr. Andreas Leineweber Max-Planck-Institut fuer Metallforschung Heisenbergstrasse 3 70569 Stuttgart Germany Telephone: +49 (0)711 689 3365 Telefax: +49 (0)711 689 3312 [EMAIL PROTECTED] http://www.mf.mpg.de/de/abteilungen/mittemeijer/english/index_english.htm