Dear Colleages: Could any of you indicate that advantages of using synchroton X-ray radiation over the X-rays obtained from a conventional diffractomer for the the microstructural characterization of polycrystalline materials?. That is, I would be specially interested to know the information on the microstructure that can be obtained using synchroton radiation and can not be obtained using conventional difractometer X-rays?. In other words, which is the additional information provided by the synchroton radiation compared with the laboratory diffractometer?. Finally, which are the advantages in terms of conditions for data collection?
Thanks in advance, Paco Luis
