Dear Rietveld Users,
I am currently working on thin layers deposit by soft chemistry on
different substrates (Al2O3, Copper, ….)
In order to analyse these samples, I am using a D8 (Bruker) with a
collimator + point detector.
We do not have any mirror to produce an intense parallel beam. We just
used some primary slit, in order to give a less divergent beam.
For the moment, I am making detector scan ( from 10° to 70° 2 theta)
with omega fixed ( from 1 to 5°).
We can have identification of the thin layer + the substrate.
I would like to have a rough idea of the thickness of the layer. I would
like to do such experiment with the decrease of the intensity of a
substrate peak versus the omega angle, and make a calculation with the
decrease of the intensity versus the omega angle. After, I will make an
hypothesis of the composition and the compact density.
My first test give nothing !!!
Does anyone have an idea, or even some reference text on such device
(powder diffractometer + collimator + point detection) and applications.
Best Whishes, François Goutenoire.
--
Dr. François Goutenoire
Maître de Conférences, IUT Le Mans
Laboratoire des Oxydes et Fluorures, UMR6010
Avenue Olivier Messiaen,
72085 Le Mans, Cedex 9
