Dear All,
We are pleased to announce the 5^th Edition of the MAUD workshop in
Caen, France:
*_Combined Analysis Using X-ray and Neutron Scattering_*, June 30th to
July 4th, 2014
Registration deadline : June 15, 2014- Official language: English
The Combined Analysis methodology is an approach allowing to extract as
maximum information as possible from x-ray, neutron and electron
scattering patterns, x-ray specular reflectivity curves and x-ray
fluorescence spectra:
-preferred orientations : ODF, pole figures,
-residual stresses: homogeneisation models of elastic tensors,
-microstructures: iso- anisotropic sizes and shapes, microstrains,
distributions, faults,
-phase analysis: crystalline or mixtures of crystallines/amorphou),
-structures, compositions
-layers' thickness, roughness
...
It uses algorithmics allowing individual algorithms to interact with
each others to reach a global minimum for simultaneously refine all
parameters of interest. The Rietveld method serves the core of the
methodology, and all is integrated in the user-friendly MAUD software,
this latter being the used software all along the workshop.
Each analysis type will be first described, then integrated in the
combined approach. Each day will be dedicated to one or two
characterization types (texture, reflectivity...) and to its practice.
Mornings will consist on theoretical sessions, and afternoons of
practical rsessions on computers.
We encourage attendees to bring their own computers to ease future use
when back home. All the educational materials will be downloadable prior
to the workshop.
People working on time-consuming or hard to elaborate, rare, subjected
to change under grinding or impossible to grind, films or multilayers...
materials should be interested in this workshop. Personal examples could
be brought to Caento be discussed and/or analyzed before or during the
workshop. Please consult us on this subject for preliminary agreement of
the organizers.
WARNING: we do privilege quality to quantity ! This would not be
reasonable to accept more than 30 participants, pedagogically speaking.
First arrived first served !
For more information about the content, detailed courses, exercises and
tutorials from this Workshop series, please visit:
http://www.ecole.ensicaen.fr/~chateign/formation/
<http://www.ecole.ensicaen.fr/%7Echateign/formation/>
For more information about the workshop, please contact Inel
[email protected] <mailto:[email protected]> or visit
http://www.inel.fr/en/news-events/workshop-2014-rietveld
<http://www.inel.fr/en/news-events/workshop-2013-rietveld>
Best regards.
Eric Berthier, Inel company, Artenay - France
Daniel Chateigner, Caen University - France
Luca Lutterotti, Trento University - Italy
--
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Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Editor: "Combined Analysis", Wiley-ISTE:
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Co-editor "Journal of Applied Crystallography", www.iucr.org
Workshops on Combined Analysis:
http://www.ecole.ensicaen.fr/~chateign/formation/
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address: CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
[email protected]
http://www.ecole.ensicaen.fr/~chateign/danielc/
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Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/
Material Properties OIpen Database (MPOD): http://www.materialproperties.org/
Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/
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