Hi List People Do any of you use NIST SRM656 in your quantitative analysis quality control?
I've recently started at a new lab, and am finding it impossible to make a physically realistic model (in Topas) that gives results anywhere near correct (or at least, close to the certificate values). As an example, using the external std approach with SRM676, I've managed to calculate there is -11 wt% amorphous in the beta-656 standard. I've tried using the silicon nitride structures given in the SRM certificate, but the papers and the ICSD entries don't list any thermal parameters. I can get the same results as given on the certificate using a siroquant model, but I don't know the provenance of the HKL files used in the analysis. Thanks in advance Matthew Rowles
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