Hi List People

Do any of you use NIST SRM656 in your quantitative analysis quality control?

I've recently started at a new lab, and am finding it impossible to make a
physically realistic model (in Topas) that gives results anywhere near
correct (or at least, close to the certificate values).

As an example, using the external std approach with SRM676, I've managed to
calculate there is -11 wt% amorphous in the beta-656 standard.

I've tried using the silicon nitride structures given in the SRM
certificate, but the papers and the ICSD entries don't list any thermal

I can get the same results as given on the certificate using a siroquant
model, but I don't know the provenance of the HKL files used in the

Thanks in advance

Matthew Rowles
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