Hi Ed

The beam is smaller than the sample over all angles. - 0.25° divergence at
250 mm radius. I also collected in constant divergence mode, so the
diffracting volume is a constant.

Matthew

On Fri, 15 Apr 2022 at 01:20, Edward Laitila <ealai...@mtu.edu> wrote:

> Just curious, is the sample as prepared in the holder wider than the beam
> width at 10 degrees where you start the scan? This is a common issue that
> not many realize that for quantitative analysis the diffracting volume is
> constant provided the sample is larger than the beam in the tube and
> detector plane. If the beam is larger than the sample at these
> angles you no longer have a constant diffracting volume and hence errors in
> the analysis. I am not sure many of the  manufactures realize this based on
> personal experience with default settings of optics for some
> instruments being much too large. Additionally, background is a major issue
> as I have found especially with amorphous materials present background
> algorithms do not do a very good job and often create the background by
> hand.
>
> Regards,
> Ed
>
> On Tue, Apr 12, 2022 at 5:14 AM Matthew Rowles <rowle...@gmail.com> wrote:
>
>> Hi all
>>
>> I've collected some more data, and am still getting spurious results, and
>> by spurious, I mean -5 wt% amorphous in SRM-alpha-656 when quantified by
>> the external method against SRM 676a.
>>
>> We had some SRM-656alpha (couldn't find any of the beta) stored in a
>> drying oven, and some SRM676a stored in a cupboard. I collected some data
>> using a D8 with Ni-filtered Cu and a lynx-eye detector (0.25° fixed
>> divergence, 250 mm radius, 2x2.5° sollers). The patterns were collected
>> consecutively (using the same program), with a single peak from SRM1976 (b,
>> I think), acting as an intensity calibrant (the intensity didn't
>> appreciably change), collected before, after, and between.
>>
>> Does anybody want to have a look at the data and see what I'm doing
>> wrong? Data available at:
>>
>> https://raw.githubusercontent.com/rowlesmr/pdCIFplotter/changing-str-to-float-conversion/data/row_Cu_676a.xy
>>
>>
>> https://raw.githubusercontent.com/rowlesmr/pdCIFplotter/changing-str-to-float-conversion/data/row_Cu_al656.xy
>>
>>
>> Thanks
>>
>> Matthew
>>
>>
>>
>>
>>
>> On Wed, 16 Mar 2022 at 21:13, Matthew Rowles <rowle...@gmail.com> wrote:
>>
>>> Hi List People
>>>
>>> Do any of you use NIST SRM656 in your quantitative analysis quality
>>> control?
>>>
>>> I've recently started at a new lab, and am finding it impossible to make
>>> a physically realistic model (in Topas) that gives results anywhere near
>>> correct (or at least, close to the certificate values).
>>>
>>> As an example, using the external std approach with SRM676, I've managed
>>> to calculate there is -11 wt% amorphous in the beta-656 standard.
>>>
>>> I've tried using the silicon nitride structures given in the SRM
>>> certificate, but the papers and the ICSD entries don't list any thermal
>>> parameters.
>>>
>>> I can get the same results as given on the certificate using a siroquant
>>> model, but I don't know the provenance of the HKL files used in the
>>> analysis.
>>>
>>>
>>> Thanks in advance
>>>
>>>
>>> Matthew Rowles
>>>
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>>
>
> --
> Dr. Edward A. Laitila
> Senior Research Engineer/Scientist II/Adjunct Assistant Professor
> Michigan Technological University
> Dept. of MSE
> Room 628 M&M Building
> (906) 369-2041
>
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