Dear Fujita-san,

please don't drop the integrated tests, or at least leave them as coding 
examples. I find them more useful than the JSON based tests, since the 
integrated tests allow me to perform certain tests only on certain 
conditions. I.e. I query the switch capabilities first and then decide 
which tests to run and which parameters to pass. I use the integrated 
tests as coding examples.

Thanks
Arne



From:   FUJITA Tomonori <[email protected]>
To:     [email protected], 
Cc:     [email protected], [email protected], 
[email protected]
Date:   02/17/2014 10:01 PM
Subject:        Re: [Ryu-devel] [PATCH] test: Treat a missing mask as not 
being   an      all-zero bit mask



On Mon, 17 Feb 2014 17:17:46 +0900 (JST)
[email protected] (YAMAMOTO Takashi) wrote:

> > I believe that it makes sense to treat a missing mask
> > as not being an all-zero bit mask.
> > 
> > The motivation for this change is to resolve the following problem
> > that I observed when running Open vSwtich's make check-ryu target.
> 
> the real problem is that ovs check-ryu creates two bridges to connect
> us while we assume a single connection.  i posted a fix to dev@ovs.

Thanks, surely, integrated tests only works with one.

new switch testes covers what old integrated tests do. It would be
great if we can have switch testes for OF1.2 and 1.4 (and drop the old
integrated tests). Any neat ideas (does not duplicate OF1.3 code) to
do such?

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