[ https://issues.apache.org/jira/browse/SANDESHA2-182?page=com.atlassian.jira.plugin.system.issuetabpanels:all-tabpanel ]
Thomas McKiernan updated SANDESHA2-182: --------------------------------------- Attachment: unifiedEventTrace.patch > Unify key trace collection and debug points > ------------------------------------------- > > Key: SANDESHA2-182 > URL: https://issues.apache.org/jira/browse/SANDESHA2-182 > Project: Sandesha2 > Issue Type: Improvement > Reporter: Thomas McKiernan > Attachments: unifiedEventTrace.patch > > > There are times when it is difficult to debug problems in sandesha2 due to > the amount of trace collected. > However, it is time consuming and difficult to isolate individual > classes/packages that are of interest. > Also, when debugging issues in a live debugger, it is often found there are > debug points in many locations. > I propose a single class used for tracing key events. > This will also be useful for live debug purposes. -- This message is automatically generated by JIRA. - You can reply to this email to add a comment to the issue online. --------------------------------------------------------------------- To unsubscribe, e-mail: [EMAIL PROTECTED] For additional commands, e-mail: [EMAIL PROTECTED]