I downloaded and compiled the current 'next' branch to try out the
modifications you made to notUsed().
I can report that SDCC is now successfully applying the rules in places
I would expect. It's now applying in 6 places whereas before it was only
2. There are still a couple of places in my code where it's not applied,
but I believe it is justified in not doing so for those; when the
peephole optimiser is following the code I believe it is running into
inline assembly (a simple "wdreset"), which aborts the scan and causes
notUsed() to return false.
It's a shame that SDCC does not natively generate code to use
t1sn.io/t0sn.io for single-bit IO register tests, because I don't
believe the peephole optimiser's behaviour in respect of inline assembly
causing rules not to be applied can (or should) be changed, and yet in
my code I need these snippets of inline assembly.
Is there any scope for changing the PDK code generation to use
t1sn.io/t0sn.io?
Regards,
Basil Hussain
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