[PATCH v3] media: v4l2-ctrls: add control for test pattern
From: Lad, Prabhakar prabhakar@ti.com
add V4L2_CID_TEST_PATTERN of type menu, which determines
the internal test pattern selected by the device.
Signed-off-by: Lad, Prabhakar prabhakar@ti.com
Signed-off-by: Manjunath Hadli manjunath.ha...@ti.com
Acked-by: Sakari Ailus sakari.ai...@iki.fi
Cc: Hans Verkuil hans.verk...@cisco.com
Cc: Laurent Pinchart laurent.pinch...@ideasonboard.com
Cc: Mauro Carvalho Chehab mche...@infradead.org
Cc: Sylwester Nawrocki s.nawro...@samsung.com
Cc: Hans de Goede hdego...@redhat.com
Cc: Kyungmin Park kyungmin.p...@samsung.com
Cc: Rob Landley r...@landley.net
---
This patches has one checkpatch warning for line over
80 characters altough it can be avoided I have kept it
for consistency.
Changes for v3:
1: Removed the menu for test pattern, pointed by Sakari.
Changes for v2:
1: Included display devices in the description for test pattern
as pointed by Hans.
2: In the menu replaced 'Test Pattern Disabled' by 'Disabled' as
pointed by Sylwester.
3: Removed the test patterns from menu as the are hardware specific
as pointed by Sakari.
Documentation/DocBook/media/v4l/controls.xml | 10 ++
drivers/media/v4l2-core/v4l2-ctrls.c |2 ++
include/linux/videodev2.h|1 +
3 files changed, 13 insertions(+), 0 deletions(-)
diff --git a/Documentation/DocBook/media/v4l/controls.xml
b/Documentation/DocBook/media/v4l/controls.xml
index f0fb08d..51e9c4e 100644
--- a/Documentation/DocBook/media/v4l/controls.xml
+++ b/Documentation/DocBook/media/v4l/controls.xml
@@ -4313,6 +4313,16 @@ interface and may change in the future./para
/tbody
/entrytbl
/row
+ row
+ entry
spanname=idconstantV4L2_CID_TEST_PATTERN/constant/entry
+ entrymenu/entry
+ /row
+ row id=v4l2-test-pattern
+ entry spanname=descr The Capture/Display/Sensors have the
capability
+ to generate internal test patterns and this are hardware specific.
This
+ test patterns are used to test a device is properly working and can
generate
+ the desired waveforms that it supports./entry
+ /row
rowentry/entry/row
/tbody
/tgroup
diff --git a/drivers/media/v4l2-core/v4l2-ctrls.c
b/drivers/media/v4l2-core/v4l2-ctrls.c
index 8f2f40b..41b7732 100644
--- a/drivers/media/v4l2-core/v4l2-ctrls.c
+++ b/drivers/media/v4l2-core/v4l2-ctrls.c
@@ -740,6 +740,7 @@ const char *v4l2_ctrl_get_name(u32 id)
case V4L2_CID_LINK_FREQ:return Link Frequency;
case V4L2_CID_PIXEL_RATE: return Pixel Rate;
case V4L2_CID_DPCM_PREDICTOR: return DPCM Predictor;
+ case V4L2_CID_TEST_PATTERN: return Test Pattern;
default:
return NULL;
@@ -841,6 +842,7 @@ void v4l2_ctrl_fill(u32 id, const char **name, enum
v4l2_ctrl_type *type,
case V4L2_CID_EXPOSURE_METERING:
case V4L2_CID_SCENE_MODE:
case V4L2_CID_DPCM_PREDICTOR:
+ case V4L2_CID_TEST_PATTERN:
*type = V4L2_CTRL_TYPE_MENU;
break;
case V4L2_CID_LINK_FREQ:
diff --git a/include/linux/videodev2.h b/include/linux/videodev2.h
index ca9fb78..7014c0b 100644
--- a/include/linux/videodev2.h
+++ b/include/linux/videodev2.h
@@ -2005,6 +2005,7 @@ enum v4l2_dpcm_predictor {
V4L2_DPCM_PREDICTOR_SIMPLE = 0,
V4L2_DPCM_PREDICTOR_ADVANCED= 1,
};
+#define V4L2_CID_TEST_PATTERN (V4L2_CID_IMAGE_PROC_CLASS_BASE
+ 4)
/*
* T U N I N G
--
1.7.4.1
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Re: [PATCH v3] media: v4l2-ctrls: add control for test pattern
On Mon September 24 2012 14:53:41 Prabhakar wrote:
From: Lad, Prabhakar prabhakar@ti.com
add V4L2_CID_TEST_PATTERN of type menu, which determines
the internal test pattern selected by the device.
Signed-off-by: Lad, Prabhakar prabhakar@ti.com
Signed-off-by: Manjunath Hadli manjunath.ha...@ti.com
Acked-by: Sakari Ailus sakari.ai...@iki.fi
Cc: Hans Verkuil hans.verk...@cisco.com
Cc: Laurent Pinchart laurent.pinch...@ideasonboard.com
Cc: Mauro Carvalho Chehab mche...@infradead.org
Cc: Sylwester Nawrocki s.nawro...@samsung.com
Cc: Hans de Goede hdego...@redhat.com
Cc: Kyungmin Park kyungmin.p...@samsung.com
Cc: Rob Landley r...@landley.net
---
This patches has one checkpatch warning for line over
80 characters altough it can be avoided I have kept it
for consistency.
Changes for v3:
1: Removed the menu for test pattern, pointed by Sakari.
Changes for v2:
1: Included display devices in the description for test pattern
as pointed by Hans.
2: In the menu replaced 'Test Pattern Disabled' by 'Disabled' as
pointed by Sylwester.
3: Removed the test patterns from menu as the are hardware specific
as pointed by Sakari.
Documentation/DocBook/media/v4l/controls.xml | 10 ++
drivers/media/v4l2-core/v4l2-ctrls.c |2 ++
include/linux/videodev2.h|1 +
3 files changed, 13 insertions(+), 0 deletions(-)
diff --git a/Documentation/DocBook/media/v4l/controls.xml
b/Documentation/DocBook/media/v4l/controls.xml
index f0fb08d..51e9c4e 100644
--- a/Documentation/DocBook/media/v4l/controls.xml
+++ b/Documentation/DocBook/media/v4l/controls.xml
@@ -4313,6 +4313,16 @@ interface and may change in the future./para
/tbody
/entrytbl
/row
+ row
+ entry
spanname=idconstantV4L2_CID_TEST_PATTERN/constant/entry
+ entrymenu/entry
+ /row
+ row id=v4l2-test-pattern
+ entry spanname=descr The Capture/Display/Sensors have the
capability
+ to generate internal test patterns and this are hardware specific.
This
+ test patterns are used to test a device is properly working and can
generate
+ the desired waveforms that it supports./entry
Some grammar/style fixes:
entry spanname=descr Some capture/display/sensor devices have
the
capability to generate test pattern images. These hardware specific
test patterns can be used to test if a device is working
properly./entry
+ /row
rowentry/entry/row
/tbody
/tgroup
diff --git a/drivers/media/v4l2-core/v4l2-ctrls.c
b/drivers/media/v4l2-core/v4l2-ctrls.c
index 8f2f40b..41b7732 100644
--- a/drivers/media/v4l2-core/v4l2-ctrls.c
+++ b/drivers/media/v4l2-core/v4l2-ctrls.c
@@ -740,6 +740,7 @@ const char *v4l2_ctrl_get_name(u32 id)
case V4L2_CID_LINK_FREQ:return Link Frequency;
case V4L2_CID_PIXEL_RATE: return Pixel Rate;
case V4L2_CID_DPCM_PREDICTOR: return DPCM Predictor;
+ case V4L2_CID_TEST_PATTERN: return Test Pattern;
default:
return NULL;
@@ -841,6 +842,7 @@ void v4l2_ctrl_fill(u32 id, const char **name, enum
v4l2_ctrl_type *type,
case V4L2_CID_EXPOSURE_METERING:
case V4L2_CID_SCENE_MODE:
case V4L2_CID_DPCM_PREDICTOR:
+ case V4L2_CID_TEST_PATTERN:
*type = V4L2_CTRL_TYPE_MENU;
break;
case V4L2_CID_LINK_FREQ:
diff --git a/include/linux/videodev2.h b/include/linux/videodev2.h
index ca9fb78..7014c0b 100644
--- a/include/linux/videodev2.h
+++ b/include/linux/videodev2.h
@@ -2005,6 +2005,7 @@ enum v4l2_dpcm_predictor {
V4L2_DPCM_PREDICTOR_SIMPLE = 0,
V4L2_DPCM_PREDICTOR_ADVANCED= 1,
};
+#define V4L2_CID_TEST_PATTERN
(V4L2_CID_IMAGE_PROC_CLASS_BASE + 4)
/*
* T U N I N G
Regards,
Hans
--
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Re: [PATCH v3] media: v4l2-ctrls: add control for test pattern
Hi Hans,
Thanks for the review,
On Mon, Sep 24, 2012 at 7:07 PM, Hans Verkuil hverk...@xs4all.nl wrote:
On Mon September 24 2012 14:53:41 Prabhakar wrote:
From: Lad, Prabhakar prabhakar@ti.com
add V4L2_CID_TEST_PATTERN of type menu, which determines
the internal test pattern selected by the device.
Signed-off-by: Lad, Prabhakar prabhakar@ti.com
Signed-off-by: Manjunath Hadli manjunath.ha...@ti.com
Acked-by: Sakari Ailus sakari.ai...@iki.fi
Cc: Hans Verkuil hans.verk...@cisco.com
Cc: Laurent Pinchart laurent.pinch...@ideasonboard.com
Cc: Mauro Carvalho Chehab mche...@infradead.org
Cc: Sylwester Nawrocki s.nawro...@samsung.com
Cc: Hans de Goede hdego...@redhat.com
Cc: Kyungmin Park kyungmin.p...@samsung.com
Cc: Rob Landley r...@landley.net
---
This patches has one checkpatch warning for line over
80 characters altough it can be avoided I have kept it
for consistency.
Changes for v3:
1: Removed the menu for test pattern, pointed by Sakari.
Changes for v2:
1: Included display devices in the description for test pattern
as pointed by Hans.
2: In the menu replaced 'Test Pattern Disabled' by 'Disabled' as
pointed by Sylwester.
3: Removed the test patterns from menu as the are hardware specific
as pointed by Sakari.
Documentation/DocBook/media/v4l/controls.xml | 10 ++
drivers/media/v4l2-core/v4l2-ctrls.c |2 ++
include/linux/videodev2.h|1 +
3 files changed, 13 insertions(+), 0 deletions(-)
diff --git a/Documentation/DocBook/media/v4l/controls.xml
b/Documentation/DocBook/media/v4l/controls.xml
index f0fb08d..51e9c4e 100644
--- a/Documentation/DocBook/media/v4l/controls.xml
+++ b/Documentation/DocBook/media/v4l/controls.xml
@@ -4313,6 +4313,16 @@ interface and may change in the future./para
/tbody
/entrytbl
/row
+ row
+ entry
spanname=idconstantV4L2_CID_TEST_PATTERN/constant/entry
+ entrymenu/entry
+ /row
+ row id=v4l2-test-pattern
+ entry spanname=descr The Capture/Display/Sensors have the
capability
+ to generate internal test patterns and this are hardware specific.
This
+ test patterns are used to test a device is properly working and
can generate
+ the desired waveforms that it supports./entry
Some grammar/style fixes:
entry spanname=descr Some capture/display/sensor devices have
the
capability to generate test pattern images. These hardware
specific
test patterns can be used to test if a device is working
properly./entry
I'll fix it in next version.
Regards,
--Prabhakar Lad
+ /row
rowentry/entry/row
/tbody
/tgroup
diff --git a/drivers/media/v4l2-core/v4l2-ctrls.c
b/drivers/media/v4l2-core/v4l2-ctrls.c
index 8f2f40b..41b7732 100644
--- a/drivers/media/v4l2-core/v4l2-ctrls.c
+++ b/drivers/media/v4l2-core/v4l2-ctrls.c
@@ -740,6 +740,7 @@ const char *v4l2_ctrl_get_name(u32 id)
case V4L2_CID_LINK_FREQ:return Link Frequency;
case V4L2_CID_PIXEL_RATE: return Pixel Rate;
case V4L2_CID_DPCM_PREDICTOR: return DPCM Predictor;
+ case V4L2_CID_TEST_PATTERN: return Test Pattern;
default:
return NULL;
@@ -841,6 +842,7 @@ void v4l2_ctrl_fill(u32 id, const char **name, enum
v4l2_ctrl_type *type,
case V4L2_CID_EXPOSURE_METERING:
case V4L2_CID_SCENE_MODE:
case V4L2_CID_DPCM_PREDICTOR:
+ case V4L2_CID_TEST_PATTERN:
*type = V4L2_CTRL_TYPE_MENU;
break;
case V4L2_CID_LINK_FREQ:
diff --git a/include/linux/videodev2.h b/include/linux/videodev2.h
index ca9fb78..7014c0b 100644
--- a/include/linux/videodev2.h
+++ b/include/linux/videodev2.h
@@ -2005,6 +2005,7 @@ enum v4l2_dpcm_predictor {
V4L2_DPCM_PREDICTOR_SIMPLE = 0,
V4L2_DPCM_PREDICTOR_ADVANCED= 1,
};
+#define V4L2_CID_TEST_PATTERN
(V4L2_CID_IMAGE_PROC_CLASS_BASE + 4)
/*
* T U N I N G
Regards,
Hans
--
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