Dear François,
if the layers are say more than 300nm, go there:
http://www.ecole.ensicaen.fr/~chateign/pdf/ICOTOM13CPSQTA.pdf
if lower, use reflectivity. Why don't you ask your, fully equipped,
neighbours ? Just few steps in the corridor, the lab aside ... or send
me your samples !
;-)
daniel
Francois Goutenoire a écrit :
Dear Rietveld Users,
I am currently working on thin layers deposit by soft chemistry on
different substrates (Al2O3, Copper, ….)
In order to analyse these samples, I am using a D8 (Bruker) with a
collimator + point detector.
We do not have any mirror to produce an intense parallel beam. We just
used some primary slit, in order to give a less divergent beam.
For the moment, I am making detector scan ( from 10° to 70° 2 theta)
with omega fixed ( from 1 to 5°).
We can have identification of the thin layer + the substrate.
I would like to have a rough idea of the thickness of the layer. I
would like to do such experiment with the decrease of the intensity of
a substrate peak versus the omega angle, and make a calculation with
the decrease of the intensity versus the omega angle. After, I will
make an hypothesis of the composition and the compact density.
My first test give nothing !!!
Does anyone have an idea, or even some reference text on such device
(powder diffractometer + collimator + point detection) and applications.
Best Whishes, François Goutenoire.
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Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Co-editor Journal of Applied Crystallography, www.iucr.org
Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com
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address: CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
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A Quantitative Texture Analysis Course:
http://qta.ecole.ensicaen.fr/
An Open Source for Crystallographic Data: the COD
http://sdpd.univ-lemans.fr/cod/
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