On Sat, 2024-01-13 at 13:57 +, Iain Sandoe wrote:
> If we want to support multiple object formats and to allow for
> scan-assembler tests, we need to make it possible to adjust the
> tests on a per-target basis.
>
> This adds similar mechamisms to jit-verify-assembler-output{,-not}
> to those
If we want to support multiple object formats and to allow for
scan-assembler tests, we need to make it possible to adjust the
tests on a per-target basis.
This adds similar mechamisms to jit-verify-assembler-output{,-not}
to those used for the general scan-assembler dg directives.
As an aside;
