Thanks!
I would like extract the strain value in, say the x-direction. Which is
difficult to extract from that bit map image. Is there a way to export data
values instead of the bitmap image?
Or is there an equation I could use that takes S400 and S220 as input?
Riley
On Thu, May 4, 2017 at
On May 4, 2017, at 12:42 PM, Riley Hanus
> wrote:
I have used the generalized anisotropic mustrain model (Cubic crystal system,
so S400 and S220 are used). The generalized anisotropic model works well in
fitting the peak broadening!
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