e data?
Carlo
On Mon, 8 Aug 2016, Siliang Chang wrote:
> Dear all,
>
>
>
> I am new to XAFS data analysis. I?m currently working on the XAFS data
> of atomic layer deposited mixed oxide thin film: SnTiOx. I have both
> Sn and Ti K edge data, and was able to fit Sn edge us
much.
Best regards,
Siliang Chang
Ti_K_edge2.prj
Description: Binary data
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