Quoting Mika Kuoppala (2018-02-13 12:17:51)
> Chris Wilson writes:
>
> > igt_partial_tiling managed to fail with an -EBUSY. This usually means a
> > pin leak, but that should be impossible given the test setup. Add a
> > couple of error messages to help identify the
Chris Wilson writes:
> igt_partial_tiling managed to fail with an -EBUSY. This usually means a
> pin leak, but that should be impossible given the test setup. Add a
> couple of error messages to help identify the path that failed.
>
> References: