On Mon, Sep 07, 2015 at 02:23:36PM +0200, Tomeu Vizoso wrote:
> When looking up an i2c adapter or device through its OF node, probe it
> if it hasn't already.
>
> The goal is to reduce deferred probes to a minimum, as it makes it very
> cumbersome to find out why a device failed to probe, and can
When looking up an i2c adapter or device through its OF node, probe it
if it hasn't already.
The goal is to reduce deferred probes to a minimum, as it makes it very
cumbersome to find out why a device failed to probe, and can introduce
very big delays in when a critical device is probed.
