El profesor John de Bruyn, Memorial University of Newfoundland, Canada
y Center for Nonlinear Dynamics, University of Texas, Austin, Texas,
especialista en sistemas lejos del estado de equilibrio visitara la
Argentina durante las dos primeras semanas de Diciembre/97 y realizara
las siguientes actividades en el contexto del laboratorio de Sistemas
Complejos del Departamento de Computacion de la FCEyN de la UBA. Se invita
a todos aquellos interesados a requerir informes a:
marsh...@cnea.edu.ar o
fmol...@q1.fcen.uba.ar o
Seminario (en idioma Ingles) titulado
Pattern formation and Hydrodynamic Instabilities
(15 hours aprox.)
The lectures will cover: nonlinear differential equations,
stability analysis, convection (Rayleigh-Benard
convection, electroconvection, natural convection),
fingering instabilities (fingering at a driven contact
line, printer's instability, Rayleigh-Taylor instability,
Goren instability), nonequilibrium growth (electrochemical
deposition).
Asimismo dara una conferencia cuyo titulo y resumen se
adjuntan:
Electroconvection in freely suspended films of
smectic liquid crystal
Abstract
Convective flow patterns driven by an applied electric field have
been studied in freely suspended films of smectic-A
liquid crystal. The films can be as few as two
molecular layers in thickness. The flow pattern
consists of an array of counter-rotating vortices,
and appears via a supercritical bifurcation (analogous
to a second order phase transition in equilibrium
thermodynamics). After a general introduction to the
study of pattern formation, I will present the results
of experiments on the behaviour of the
electroconvective flow pattern at and above the onset
of convection. The results can be understood in terms
of a description in terms of a universal equation for
the convective amplitude. This equation can be
arrived at by symmetry arguments, and can also be
derived rigorously from the electrohydrodynamic
equations of motion.
Asimismo realizara una serie de ensayos experimentales
sobre electrodeposicion en celdas delgadas y mediciones de
concentracion por el metodo shadowgraph y schlieren.
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