Re: Literature on Rietveld limitations in nano materials

2019-06-11 Thread Frank Girgsdies

Dear Rietvelders,

Thank you for your numerous replies, which give me a bunch of references 
to read through.
Please take my apologies that I'm not able to reply and say thank you to 
all contributors individually.


With kind regards,
Frank Girgsdies

On 07.06.2019 15:36, Darren Broom wrote:

Dear Frank

With regard to accurately determining the size of small particles or nano-crystallites, 
have you seen this article on "Pitfalls in the characterization of nanoporous and 
nanosized materials" by Claudia Weidenthaler?

https://pubs.rsc.org/en/content/articlelanding/2011/nr/c0nr00561d

Best regards,

Darren


-Original Message-
From: girgs...@fhi-berlin.mpg.de
Sent: Thu, 6 Jun 2019 12:39:29 +0200
To: rietveld_l@ill.fr
Subject: Literature on Rietveld limitations in nano materials

Dear fellow Rietvelders,

Could anyone point me to some nice literature which critically discusses
the limitations of the Rietveld method when it comes to nano-crystalline
materials (specifically in the 1 to 3 nm range)?
As far as I'm aware, the core Rietveld literature seems to touch this
point only in the passing.

Background:
To the best of my knowledge, Rietveld-derived parameters (like lattice
constants or domain sizes) should not be trusted as being "physically
meaningful"  anymore when you fit the powder pattern of a material in
the few nm range with standard Rietveld tools.
My naive understanding of this problem is that the physical principles
of diffraction (or rather the best way to model it) gradually change
when you go from long-range ordered to medium-/short-range ordered
materials.
Being a Rietveld practitioner rather than a theoretician, and having no
first-hand experience with WPPM and PDF methods, I am often confronted
with the problem to explain to my "customers" why I can't extract
trustworthy lattice constants or domain sizes from their
nano-crystalline samples, especially if it seems technically possible to
fit the pattern with a Rietveld program.
I think it would be nice if I could cite some critical discussion, or
overview article with further references, to put my finger on the
problem.
Especially in the catalysis community literature, my impression is that
the applicability of the Rietveld method is sometimes overestimated,
leading to overinterpretation of the results.

Any suggestions?

Best wishes,
Frank Girgsdies



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Re: Empyrean change in configuration

2019-06-11 Thread Breogán Pato Doldán
Thank you all for you help.

Panalytical has already contacted me and they have offered their assisstance to 
solve it.


I am using the following:

Source Cu LFF at 45 kV 40 mA.

Focusing mirror, ½º divergence slit, 0.04 rad soller slits, anti-scatter 
device, ½º anti-scatter slit.

Sample changer R-T spinner 943006080001

Fixed anti-scatter for capillary spinner. Pixcel1D dectector 9430030 18x0x.


Kind regards,

Breogán



De: rohlicek 
Enviado: martes, 11 de junio de 2019 11:46:49
Para: Cristóbal Verdugo
Cc: rietveld_l@ill.fr; Breogán Pato Doldán
Asunto: Re: Empyrean change in configuration

Dear Breogán,

most probably, you have to make alignment of the primary beam cut. If
you use focusing mirror, the beam cutter should be there, see the
picture here:
https://drive.google.com/file/d/1SLbYfw90cikML_tE19Xp0ZHgBBNtTc9Y/view?usp=sharing


Jan


Dne 2019-06-11 11:17, Cristóbal Verdugo napsal:
> Hi Breogan,
>
> Not with Panalytical but with Bruker diffractometer I had the same
> problem, we are close to the direct beam. What I did was to cronstruct
> a circular slit to cut the direct beam and now I can measure from 2
> degrees.
> Please, feel free to contact me for help.
>
> Regards,
>
> Cristóbal
>
> —
> Dr. Cristóbal Verdugo-Escamilla
>
> cristobal.verd...@csic.es
> Phone. 0034 677350122
> El 11 jun 2019 11:10 +0200, Breogán Pato Doldán
> , escribió:
>
>> Dear Rietvelders,
>>
>> First of all, I would like to thank you for your help. I joined the
>> mailing list during the first year of my PhD studies. The Rietveld
>> mailing list has proved to be a quite useful tool through these
>> years.
>>
>> I have just arrived to a new lab and I am the only one with some
>> XRPD experience.
>>
>> Several months ago an Empyrean from Panalytical was installed in the
>> lab. The diffractometer is configured on transmisión. I have had
>> some problems recording data at low angles (below 5 degrees) ¿Has
>> anyone had the same problem?
>>
>> Best regards,
>>
>> Breogán Pato
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Re: Empyrean change in configuration

2019-06-11 Thread rohlicek

Dear Breogán,

most probably, you have to make alignment of the primary beam cut. If 
you use focusing mirror, the beam cutter should be there, see the 
picture here:

https://drive.google.com/file/d/1SLbYfw90cikML_tE19Xp0ZHgBBNtTc9Y/view?usp=sharing


Jan


Dne 2019-06-11 11:17, Cristóbal Verdugo napsal:

Hi Breogan,

Not with Panalytical but with Bruker diffractometer I had the same
problem, we are close to the direct beam. What I did was to cronstruct
a circular slit to cut the direct beam and now I can measure from 2
degrees.
Please, feel free to contact me for help.

Regards,

Cristóbal

—
Dr. Cristóbal Verdugo-Escamilla

cristobal.verd...@csic.es
Phone. 0034 677350122
El 11 jun 2019 11:10 +0200, Breogán Pato Doldán
, escribió:


Dear Rietvelders,

First of all, I would like to thank you for your help. I joined the
mailing list during the first year of my PhD studies. The Rietveld
mailing list has proved to be a quite useful tool through these
years.

I have just arrived to a new lab and I am the only one with some
XRPD experience.

Several months ago an Empyrean from Panalytical was installed in the
lab. The diffractometer is configured on transmisión. I have had
some problems recording data at low angles (below 5 degrees) ¿Has
anyone had the same problem?

Best regards,

Breogán Pato
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Re: Empyrean change in configuration

2019-06-11 Thread Eduard E. Levin
Dear Breogán Pato,

not that I offer some assistance, but have a word of advice. I know that 
PANalytical people read the list, so for them and other experts a little bit 
more information is required to assist with your issue.
Could you please be more specific?
What kind of problems you face? For example, high tail of the primary beam, 
complete intensity cut-off, something else?
What is the configuration of your machine? Sample holder type, primary beam 
optics, if any, slits configuration? What kind of detector do you use?

I hope that helps.

Kind regards,
Eduard Levin

From: Breogán Pato Doldán 
Sent: Tuesday, June 11, 2019 12:08 PM
To: rietveld_l@ill.fr 
Subject: Empyrean change in configuration

Dear Rietvelders,



First of all, I would like to thank you for your help. I joined the mailing 
list during the first year of my PhD studies. The Rietveld mailing list has 
proved to be a quite useful tool through these years.



I have just arrived to a new lab and I am the only one with some XRPD 
experience.

Several months ago an Empyrean from Panalytical was installed in the lab. The 
diffractometer is configured on transmisión. I have had some problems recording 
data at low angles (below 5 degrees) ¿Has anyone had the same problem?




Best regards,

Breogán Pato




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Re: Empyrean change in configuration

2019-06-11 Thread Cristóbal Verdugo
Hi Breogan,

Not with Panalytical but with Bruker diffractometer I had the same problem, we 
are close to the direct beam. What I did was to cronstruct a circular slit to 
cut the direct beam and now I can measure from 2 degrees.
Please, feel free to contact me for help.

Regards,

Cristóbal

—
Dr. Cristóbal Verdugo-Escamilla
cristobal.verd...@csic.es
Phone. 0034 677350122
El 11 jun 2019 11:10 +0200, Breogán Pato Doldán , escribió:
> Dear Rietvelders,
>
> First of all, I would like to thank you for your help. I joined the mailing 
> list during the first year of my PhD studies. The Rietveld mailing list has 
> proved to be a quite useful tool through these years.
>
> I have just arrived to a new lab and I am the only one with some XRPD 
> experience.
> Several months ago an Empyrean from Panalytical was installed in the lab. The 
> diffractometer is configured on transmisión. I have had some problems 
> recording data at low angles (below 5 degrees) ¿Has anyone had the same 
> problem?
>
> Best regards,
> Breogán Pato
> ++
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> Send commands to  eg: HELP as the subject with no body text
> The Rietveld_L list archive is on 
> http://www.mail-archive.com/rietveld_l@ill.fr/
> ++
>
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Empyrean change in configuration

2019-06-11 Thread Breogán Pato Doldán
Dear Rietvelders,


First of all, I would like to thank you for your help. I joined the mailing 
list during the first year of my PhD studies. The Rietveld mailing list has 
proved to be a quite useful tool through these years.


I have just arrived to a new lab and I am the only one with some XRPD 
experience.

Several months ago an Empyrean from Panalytical was installed in the lab. The 
diffractometer is configured on transmisión. I have had some problems recording 
data at low angles (below 5 degrees) ¿Has anyone had the same problem?


Best regards,

Breogán Pato
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