Combined Analysis Workshop, Caen, France

2021-05-10 Thread Daniel Chateigner

Dear All,

We now know that our Workshop can be organized on-site, thanks to 
progressive borders reopening and vaccinations.


The 11th session of the Combined Analysis Workshop will take place in 
Caen France from July 5th to July 9th, 2021.


The training will cover many aspects of "Combined Analysis" by X-ray and 
neutron scattering, ranging from fundamental requirements to technically 
relevant industrial and academic applications : Diffraction technique, 
Texture Analysis, Residual Stress Analysis, Rietveld analysis, 
Reflectivity analysis, Phase and line broadening analysis, The combined 
solution, XRD and XRF combined analysis, Electron Microscopy, Using the 
MAUD software...


To get a first taste, visit the Workshop website: 
http://www.ecole.ensicaen.fr/~chateign/formation/


Hope to welcome to in Caen, still are remaining few places.

Daniel Chateigner, Stéphanie Gascoin, Luca Lutterotti


--

------
Daniel Chateigner
Professeur Normandie Universite
www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Universite de Caen Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
daniel.chateig...@ensicaen.fr
--
Open Databases:
Material Properties Open Database (MPOD): mpod.cimav.edu.mx
Crystallography Open Database (COD): www.crystallography.net/cod/
  Theoretical (TCOD): www.crystallography.net/tcod/
  Predicted   (PCOD): www.crystallography.net/pcod/
Raman Open Database (ROD): solsa.crystallography.net/rod/
Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/
--

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Combined Analysis Workshop in Caen, France

2021-03-31 Thread Daniel Chateigner

Dear Colleagues,

We are organizing the 11^th workshop on Combined Analysis Using Ray 
Scattering**, July 5^th - 9^th 2021, in Caen, France.


We hope the worldwide situation evolves positively so that this workshop 
can take place.


More details here:

Agenda: 
http://www.ecole.ensicaen.fr/~chateign/formation/agendas/Flyer-workshop-CA-2021.pdf 



<http://www.ecole.ensicaen.fr/~chateign/formation/Programs/2020_CombinedAnalysis_flyer.pdf>Program: 
http://www.ecole.ensicaen.fr/~chateign/formation/Programs/2021-program_11th_workshop.pdf


* _Registration links:_

French:https://www.azur-colloque.fr/DR19/inscription/inscription/55/fr 
<https://www.azur-colloque.fr/DR19/inscription/inscription/55/fr>


English: https://www.azur-colloque.fr/DR19/inscription/inscription/55 
<https://www.azur-colloque.fr/DR19/inscription/inscription/55>


* _Registration deadline_ : *June 15^th *, 2021


To get more insights about Combined Analysis visit the web site: 
http://www.ecole.ensicaen.fr/~chateign/formation/ 
<http://www.ecole.ensicaen.fr/~chateign/formation/>


Sincerely,
Stéphanie Gascoin, Daniel Chateigner, Luca Lutterotti

*/What is the Combined Analysis approach?/*
Quickly, the Combined Analysis methodology is an approach allowing to 
extract as maximum information as possible from scattering patterns 
[preferred orientations (ODF, pole figures), residual stresses 
(homogenisation models of elastic tensors), microstructures (iso- 
anisotropic sizes, microstrains, distributions, faults), phase analysis 
(crystalline or mixtures of crystallines/amorphous), structures, 
thickness and roughness (specular reflectivity)], x-ray reflectivity and 
fluorescence. It allows individual algorithms to interact with each 
other to reach a global minimum for simultaneously all the refined 
parameters. The Rietveld method serves the core of the methodology, and 
all is integrated in the user-friendly software MAUD.
Each analysis type will be first described, then integrated in the 
combined approach, and each day of the workshop will be dedicated to one 
or two characterisation type (texture, reflectivity ...) and to its 
practice. Mornings will consist of courses, afternoons of practical 
training on your own computers.

All the materials will be downloadable prior to the workshop.

People working on real materials (time-consuming or hard to elaborate, 
rare, subjected to change under grinding or impossible to grind, films 
or multilayers, ...), are a priori interested by this workshop.
Personal examples can be brought to Caen, might be measured before or 
during the workshop.


--

----------
Daniel Chateigner
Professeur Normandie Universite
www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Universite de Caen Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
daniel.chateig...@ensicaen.fr
--
Open Databases:
Material Properties Open Database (MPOD): mpod.cimav.edu.mx
Crystallography Open Database (COD): www.crystallography.net/cod/
  Theoretical (TCOD): www.crystallography.net/tcod/
  Predicted   (PCOD): www.crystallography.net/pcod/
Raman Open Database (ROD): solsa.crystallography.net/rod/
Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/
--

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Re:

2020-05-02 Thread Daniel Chateigner

Dear Shay,

The last MAUD version is here, please first check if you run the latest:

http://maud.radiographema.com

Examples of configured experiments including layered samples are also 
available at:


http://www.ecole.ensicaen.fr/~chateign/formation/

In the meantime, can you send your .par file for checking ?

sincerely

daniel

Le 02/05/2020 à 13:20, Shay Tirosh a écrit :

Dear Rietvelders

Specifically to the MAUD community.
Some features in MAUD are not working properly (in my case).
 For example:
1. I wish to model to layers. The upper layer is a film contains a 
mixture of three phases. Beneath a layer (film) with a single phase. 
However, it seems that modeling using layers does not work. 
Specifically editing layers does not allows picking a few phases in a 
single layer. And It is impossible to pick different phases in 
different layers. MAUD let me define two layers, each contains all 
phases (four phases). I tried to "cheat" and fix the volume fraction 
flowing my model and it doesn't work. MAUD does not count layer 2 even 
if I nullify the thickness of layer 1.

2. I am unable to create multiple samples (add object does not work).
3. The appearance of all curves in the plot are all black. The data 
set color and the computed CIF are black. Also, the color of the 
corresponding labeled phases are all black with no option to change it.


Please note that problem 3 has been eliminated in case I am running a 
similar project on a different computer (identical MAUD version).


1. Can you comment?
2. Any Suggestions?

Thank you from advance
Shay



--
_
Dr. Shay Tirosh
Institute for Nanotechnology & Advanced Materials
Bar Ilan University
Ramat Gan, 52900
Israel
Phone: +972-(0)30-531-7320
Mobile: +972-(0)54-8834533
Email: stiro...@gmail.com <mailto:stiro...@gmail.com>
_

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--

----------
Daniel Chateigner
Professeur Normandie Universite
www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Universite de Caen Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
daniel.chateig...@ensicaen.fr
--
Open Databases:
Material Properties Open Database (MPOD): mpod.cimav.edu.mx
Crystallography Open Database (COD): www.crystallography.net/cod/
  Theoretical (TCOD): www.crystallography.net/tcod/
  Predicted   (PCOD): www.crystallography.net/pcod/
Raman Open Database (ROD): solsa.crystallography.net/rod/
Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/
--

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Re: pdf cards for Li2SiO3

2020-04-13 Thread Daniel Chateigner

Dear Angel,

You have the cif file on COD here:

http://www.crystallography.net/cod/2310662.html

sincerely

daniel

Le 13/04/2020 à 11:35, Angel L. Ortiz a écrit :

Dear colleagues,

Could any of you email me the pdf cards for Li2SiO3?

Thanks

Angel
--
Angel L. Ortiz, PhD
Associate Professor (Reader)
Materials Science and Engineering
Department of Mechanical, Energy and Materials Engineering
University of Extremadura, Badajoz 06006, Spain
(34) 924289600 Ext:86726 (Phone)
(34) 924289601 (Fax)
http://materiales.unex.es/miembros/personal/al-ortiz/index.html
---

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--

--
Daniel Chateigner
Professeur Normandie Universite
www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Universite de Caen Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
daniel.chateig...@ensicaen.fr
--
Open Databases:
Material Properties Open Database (MPOD): mpod.cimav.edu.mx
Crystallography Open Database (COD): www.crystallography.net/cod/
  Theoretical (TCOD): www.crystallography.net/tcod/
  Predicted   (PCOD): www.crystallography.net/pcod/
Raman Open Database (ROD): solsa.crystallography.net/rod/
Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/
--

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New Panalytical x-ray tubes ?

2018-02-01 Thread Daniel Chateigner

Dear Colleagues,

We recently got the information that, on Panalytical instruments, new 
x-ray tubes will be produced that will require new high voltage cables ...
Consequently, the new tubes will be more expensive, without accounting 
for the price of the high-voltage cable, per instrument.


This will in return, except for larger tube lifetimes, condition our 
future acquisitions.


Have some of you heard about this or is it only a rumor ?

cheers
daniel

--

--
Daniel Chateigner
Professeur Normandie Universite
www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Universite de Caen Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
--
Open Databases:
Material Properties Open Database (MPOD): mpod.cimav.edu.mx
Crystallography Open Database (COD): www.crystallography.net/cod/
  Theoretical (TCOD): www.crystallography.net/tcod/
  Predicted   (PCOD): www.crystallography.net/pcod/
Raman Open Database (ROD): solsa.crystallography.net/rod/
Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/
--

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[no subject]

2017-03-23 Thread Daniel Chateigner

Dear Colleagues,

As you certainly know, the UN ban treaty negotiations will start on 
March 27. This is one important step towards nuclear weapons abolition.


The Future of Life Institute has issued an open letter supporting the 
negotiations: https://futureoflife.org/nuclear-open-letter/


It is also copied in this email at the bottom. The open letter has been 
signed already by more than 2000 scientists of the STEM fields.


We ask you to sign and spread this information before March 27.

*/An Open Letter from Scientists in Support of the UN Nuclear Weapons 
Negotiations/*


/Nuclear arms are the only weapons of mass destruction not yet 
prohibited by an international convention, even though they are the most 
destructive and indiscriminate weapons ever created. We scientists bear 
a special responsibility for nuclear weapons, since it was scientists 
who invented them and discovered that their effects are even more 
horrific than first thought. Individual explosions can obliterate 
cities, radioactive fallout can contaminate regions, and a high-altitude 
electromagnetic pulse may cause mayhem by frying electrical grids and 
electronics across a continent. The most horrible hazard is a 
nuclear-induced winter, in which the fires and smoke from as few as a 
thousand detonations might darken the atmosphere enough to trigger a 
global mini ice age with year-round winter-like conditions. This could 
cause a complete collapse of the global food system and apocalyptic 
unrest, potentially killing most people on Earth – even if the nuclear 
war involved only a small fraction of the roughly 14,000 nuclear weapons 
that today’s nine nuclear powers control. As Ronald Reagan said: “A 
nuclear war cannot be won and must never be fought.”/


/
Unfortunately, such a war is more likely than one may hope, because it 
can start by mistake, miscalculation or terrorist provocation. There is 
a steady stream of accidents and false alarms that could trigger all-out 
war, and relying on never-ending luck is not a sustainable strategy. 
Many nuclear powers have larger nuclear arsenals than needed for 
deterrence, yet prioritize making them more lethal over reducing them 
and the risk that they get used./


/But there is also cause for optimism. On March 27 2017, an 
unprecedented process begins at the United Nations: most of the world’s 
nations convene to negotiate a ban on nuclear arms, to stigmatize them 
like biological and chemical weapons, with the ultimate goal of a world 
free of these weapons of mass destruction. We support this, and urge our 
national governments to do the same, because nuclear weapons threaten 
not merely those who have them, but all people on Earth./


Thanks for your support.

Best regards,

Lucas Wirl

--

INES

Marienstr. 19/20

10117 Berlin

www.inesglobal.net <http://www.inesglobal.net>

--

--
Daniel Chateigner
Professeur Normandie Universite
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: 
http://www.ecole.ensicaen.fr/~chateign/formation/
Advisory Board: Zeitschrift für Kristallographie
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
--
Open Databases:
Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/
Material Properties Open Database (MPOD): http://www.materialproperties.org/
Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/
  Theoretical (TCOD): http://sdpd.univ-lemans.fr/cod/tcod/
  Predicted   (PCOD): http://sdpd.univ-lemans.fr/cod/pcod/
--

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Re: Asking for Cif file.

2015-10-19 Thread Daniel Chateigner

Dear Gili,

You can get the Bi2La2Ti3O12 phase from the COD, number 1532556

daniel

Le 19/10/2015 10:32, גילי כהן תאגורי a écrit :


Hi all,

I'll really appreciate if someone can give me the cif file of 
Bi3.25La0.75Ti3O12 ( ICSD No. 150091).


Thanks in advance,

Gili

Gili Taguri

Bar Ilan institute of Nanotechnology and advanced Material (BINA)

Bar Ilan Universtiy



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--

------
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: 
http://www.ecole.ensicaen.fr/~chateign/formation/
Advisory Board: Zeitschrift für Kristallographie
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
--
Open Databases:
Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/
Material Properties Open Database (MPOD): http://www.materialproperties.org/
Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/
  Theoretical (TCOD): http://sdpd.univ-lemans.fr/cod/tcod/
  Predicted   (PCOD): http://sdpd.univ-lemans.fr/cod/pcod/
--

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Postdoc position available at CRISMAT

2015-09-22 Thread Daniel Chateigner

Dear All,

Please find information about a 4-years postdoc position, targetted 
opening period Jan 2016, at CRISMAT-Caen:

http://www.ecole.ensicaen.fr/~chateign/projets/SOLSA/Post-doc_fellow-SOLSA_DC.pdf

sincerely
daniel

--

--
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
Editor: "Combined Analysis", Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: 
http://www.ecole.ensicaen.fr/~chateign/formation/
Advisory Board: Zeitschrift für Kristallographie
--
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
--
Open Databases:
Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/
Material Properties Open Database (MPOD): http://www.materialproperties.org/
Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/
  Theoretical (TCOD): http://sdpd.univ-lemans.fr/cod/tcod/
  Predicted   (PCOD): http://sdpd.univ-lemans.fr/cod/pcod/
--

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Re: PO corrections in trigonal space groups?

2014-03-25 Thread daniel Chateigner

Hi Matthew,

You would perhaps prefer physically meaningfull PO correction using 
standard functions, at disposal in Maud. If you can give me an ascii 
double column of your data I'll give it a trial.


daniel

Le 25/03/2014 11:43, Matthew Rowles a écrit :

Hi all

I have a sample containing a fraction of calcite. My research tells me 
that calcite cleaves on {10-11}.


How can I express this as an hkl for the March-Dollase PO correction?

By inspection, {104} is the direction that orients. Is that correct? 
How can I derive that?



Thanks


Matthew Rowles


--
http://www.ecole.ensicaen.fr/~chateign/danielc/

Address:
IUT-Caen Université de Caen Basse-Normandie and
CRISMAT-ENSICAEN
6 Bd. M. Juin, 14050 Caen

The Crystallography Open Database: www.crystallography.net
The Materials Property Open Database: http://www.materialproperties.org/
Combined Analysis using rays: http://iste.co.uk/index.php?f=xACTION=Viewid=359

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5th Edition of MAUD workshop in Caen, France June 30th to July 4th, 2014

2014-02-10 Thread Daniel Chateigner

Dear All,

We are pleased to announce the 5^th Edition of the MAUD workshop in 
Caen, France:


*_Combined Analysis Using X-ray and Neutron Scattering_*, June 30th to 
July 4th, 2014


Registration deadline : June 15, 2014- Official language: English

The Combined Analysis methodology is an approach allowing to extract as 
maximum information as possible from x-ray, neutron and electron 
scattering patterns, x-ray specular reflectivity curves and x-ray 
fluorescence spectra:


-preferred orientations : ODF, pole figures,

-residual stresses: homogeneisation models of elastic tensors,

-microstructures: iso- anisotropic sizes and shapes, microstrains, 
distributions, faults,


-phase analysis: crystalline or mixtures of crystallines/amorphou),

-structures, compositions

-layers' thickness, roughness
...

It uses algorithmics allowing individual algorithms to interact with 
each others to reach a global minimum for simultaneously refine all 
parameters of interest. The Rietveld method serves the core of the 
methodology, and all is integrated in the user-friendly MAUD software, 
this latter being the used software all along the workshop.


Each analysis type will be first described, then integrated in the 
combined approach. Each day will be dedicated to one or two 
characterization types (texture, reflectivity...) and to its practice. 
Mornings will consist on theoretical sessions, and afternoons of 
practical rsessions on computers.


We encourage attendees to bring their own computers to ease future use 
when back home. All the educational materials will be downloadable prior 
to the workshop.


People working on time-consuming or hard to elaborate, rare, subjected 
to change under grinding or impossible to grind, films or multilayers... 
materials should be interested in this workshop. Personal examples could 
be brought to Caento be discussed and/or analyzed before or during the 
workshop. Please consult us on this subject for preliminary agreement of 
the organizers.



WARNING: we do privilege quality to quantity ! This would not be 
reasonable to accept more than 30 participants, pedagogically speaking. 
First arrived first served !



For more information about the content, detailed courses, exercises and 
tutorials from this Workshop series, please visit:
http://www.ecole.ensicaen.fr/~chateign/formation/ 
http://www.ecole.ensicaen.fr/%7Echateign/formation/



For more information about the workshop, please contact Inel 
i...@inel.fr mailto:i...@inel.fr or visit 
http://www.inel.fr/en/news-events/workshop-2014-rietveld 
http://www.inel.fr/en/news-events/workshop-2013-rietveld


Best regards.

Eric Berthier, Inel company, Artenay - France

Daniel Chateigner, Caen University - France

Luca Lutterotti, Trento University - Italy

--

--
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Editor: Combined Analysis, Wiley-ISTE: 
http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Co-editor Journal of Applied Crystallography, www.iucr.org
Workshops on Combined Analysis: 
http://www.ecole.ensicaen.fr/~chateign/formation/
--
address: CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/
Material Properties OIpen Database (MPOD): http://www.materialproperties.org/
Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/
--

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Combined Analysis Workshop

2010-03-04 Thread Daniel Chateigner

Dear Colleagues,

We are organising the following workshop in Caen, France:

*Combined Analysis Using X-ray and Neutron Scattering*
June 28th - July 2nd, 2010, Caen (France)
Registration deadline : June 1st, 2010

Please visit the web site: http://www.inel.fr/news/page.asp?n=39

The Combined Analysis methodology is an approach allowing to extract as 
maximum information as possible from scattering patterns [preferred 
orientations (ODF, pole figures), residual stresses (homogeneisation 
models of elastic tensors), microstructures (iso- anisotropic sizes, 
microstrains, distributions, faults), phase analysis (crystalline or 
mixtures of crystallines/amorphous), structures, thickness and roughness 
(specular reflectivity)]. It uses algoritmics allowing individual 
algorithms to interact with each others to reach a global minimum for 
simulataneously all the refined parameters. The Rietveld method serves 
the core of the methodology, and all is integrated in the user-friendly 
software MAUD.
Each analysis type will be first described, then integrated in the 
combined approach, and each day of the workshop will be dedicated to one 
or two characterisation type (texture, reflectivity ...) and to its 
practice. Mornings will consist of courses, afternoons of practical 
training on computers.
Participants are encouraged to bring their own computers to easy future 
use when back home. All the materials will be downloadable prior to the 
workshop.


People working on real materials (time-consuming or hard to elaborate, 
rares, subjected to change under grinding or impossible to grind, films 
or multilayers, ...), are a priori interested by this workshop. Personal 
exemples can be brought to Caen, can be measured before or during the 
workshop.


sincerely
daniel


--

--
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Co-editor Journal of Applied Crystallography, www.iucr.org
Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com
--
address: CRISMAT-ENSICAEN and IUT-Caen, 
Université de Caen Basse-Normandie, campus 2

6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
A Quantitative Texture Analysis Course:
http://qta.ecole.ensicaen.fr/
An Open Source for Crystallographic Data: the COD
http://sdpd.univ-lemans.fr/cod/
--




Re: diffraction patterns or spectra

2010-02-11 Thread Daniel Chateigner


shall we say spectra is more general then ? since monocinetic measurements 
are never perfectly mono ?  

daniel Radovan Cerny radovan.ce...@unige.ch a écrit : 

 For single energy (single wavelength) experiment the correct term is
 diffraction pattern. For multi energy (energy dispersive, ToF)
 experiment, the correct term is diffraction spectrum.

 From http://www.etymonline.com/ :

 pattern (n.)
 1324, the original proposed to imitation; the archetype; that which
 is to be copied; an exemplar [Johnson], from O.Fr. patron, from M.L.
 patronus (see patron). Extended sense of decorative design first
 recorded 1582, from earlier sense of a patron as a model to be
 imitated. The difference in form and sense between patron and pattern
 wasn't firm till 1700s. Meaning model or design in dressmaking
 (especially one of paper) is first recorded 1792, in Jane Austen.
 Verb phrase pattern after take as a model is from 1878.

 spectrum
 1611, apparition, specter, from L. spectrum appearance, image,
 apparition, from specere to look at, view (see scope (1)). Meaning
 band of colors formed from a beam of light first recorded 1671.
 Spectroscope (1861) is a hybrid, with Gk. -skopion, from skopein to
 look at, examine, which is from the same PIE root as spectrum.
 specter


 Radovan


 Lubomir Smrcok a écrit :
 Spectrum:
 from Latin spectrum appearance, specter, from specere to look, look at


 Lubo


 On Thu, 11 Feb 2010, amar...@chimica.unige.it wrote:

 Dear all,

 I see that in scientific literature (also in  high-impact factor scientific
 journals) the diffraction patterns are often referred to as diffraction
 spectra. But we all know that diffraction is not a spectroscopic technique.
 Should we pay more attention on this aspect when we write or refer a paper?
 What about?

 Best regards,
 Alberto






 --
 Radovan Cerny
 Laboratoire de Cristallographie
 24, quai Ernest-Ansermet
 CH-1211 Geneva 4, Switzerland
 Phone  : [+[41] 22] 37 964 50, FAX : [+[41] 22] 37 961 08
 mailto : radovan.ce...@unige.ch
 URL: http://www.unige.ch/sciences/crystal/cerny/rcerny.htm





Ce message a ete genere avec le webmail Horde-IMP de l'ENSICAEN.

Re: Preferred orientation question

2010-02-10 Thread Daniel Chateigner

Dear Ross,

I presume on the flat sample you measured regular theta-2theta diagrams, 
then only probed those planes parallel to the sample plane. In such a 
situation, you do not probe correctly the texture, and all the models 
you could envisage are just giving back parameters that have been 
refined on non-physic grounds. Harmonics will render a very nice fit, 
just adding on the number of parameters in the development. Measuring 
the full spectra in order to resolve structural parameters of a textured 
sample requires that you acquire data in more than few sample 
orientations, then the quantitative textural information brings 
orientational physics in the Rietveld fits 
(http://www.ecole.ensicaen.fr/~chateign/texture/combined.pdf). For this 
you need to put the sample in a 4-circle diffractometer.


cheers
daniel


Ross H Colman a écrit :

Dear All,

Could anybody help me with a question I have related to preferred
orientation?

I have collected some spectra of a sample, on a D4 using flat plate
geometry, that I suspect is showing preferred orientation effects. I was
under the impression that a way of testing for this is to re-pack the
sample, re-run and compare the spectra, as the level of preferred
orientation should change between packings and so the spectra should
differ slightly. Despite re-packing and comparing spectra from up to 8
scans the spectra overlay perfectly (within noise). This suggests to me
that the refinement residuals are probably not due to preferred
orientation.
I am using Topas to refine the data and despite the comment above, the
residuals seem best fitted using a spherical harmonic-prefered orientation
model. I have also tried using other parameters to fit the residuals such
as the occupancy of some of the sites, using anisotropic displacement
parameters or anisotropic broadening effects, but the SH-PO fits best and
seems the most physically reasonable treatment.

As a test, I have also run the sample in capillary transmission geometry
on another instrument, and the refined value of the SH-PO parameter is
reduced. This seems to confirm that PO is the problem, but the question I
have is how effective the re-packing comparison method is for confirming
PO? If I see no difference in the spectra does it confirm that PO is NOT
the problem or can I still have PO effects that are very repeatable upon
repeat packing?

If PO is not the problem in this case, are there any other structural or
instrument effects that could lead to refinement residuals that would be
well treated with a SH-PO model?

Thank you all very much for any information or light you can shed on the
subject.
Ross Colman


  



--

--
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Co-editor Journal of Applied Crystallography, www.iucr.org
Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com
--
address: CRISMAT-ENSICAEN and IUT-Caen, 
Université de Caen Basse-Normandie, campus 2

6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
A Quantitative Texture Analysis Course:
http://qta.ecole.ensicaen.fr/
An Open Source for Crystallographic Data: the COD
http://sdpd.univ-lemans.fr/cod/
--




Re: Thickness measurement

2010-01-26 Thread Daniel Chateigner

Dear François,

if the layers are say more than 300nm, go there: 
http://www.ecole.ensicaen.fr/~chateign/pdf/ICOTOM13CPSQTA.pdf


if lower, use reflectivity. Why don't you ask your, fully equipped, 
neighbours ? Just few steps in the corridor, the lab aside ... or send 
me your samples !


;-)
daniel

Francois Goutenoire a écrit :

Dear Rietveld Users,

I am currently working on thin layers deposit by soft chemistry on 
different substrates (Al2O3, Copper, ….)


In order to analyse these samples, I am using a D8 (Bruker) with a 
collimator + point detector.


We do not have any mirror to produce an intense parallel beam. We just 
used some primary slit, in order to give a less divergent beam.


For the moment, I am making detector scan ( from 10° to 70° 2 theta) 
with omega fixed ( from 1 to 5°).


We can have identification of the thin layer + the substrate.

I would like to have a rough idea of the thickness of the layer. I 
would like to do such experiment with the decrease of the intensity of 
a substrate peak versus the omega angle, and make a calculation with 
the decrease of the intensity versus the omega angle. After, I will 
make an hypothesis of the composition and the compact density.


My first test give nothing !!!

Does anyone have an idea, or even some reference text on such device 
(powder diffractometer + collimator + point detection) and applications.


Best Whishes, François Goutenoire.




--

--
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Co-editor Journal of Applied Crystallography, www.iucr.org
Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com
--
address: CRISMAT-ENSICAEN and IUT-Caen, 
Université de Caen Basse-Normandie, campus 2

6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
A Quantitative Texture Analysis Course:
http://qta.ecole.ensicaen.fr/
An Open Source for Crystallographic Data: the COD
http://sdpd.univ-lemans.fr/cod/
--




X'PERT PRO

2009-10-05 Thread Daniel Chateigner

Dear all,

We bought a X'PERT PRO 14 years ago with all the optics possibilities at 
that time (Bartels, Hybrids, Texture, Solllers of all kinds, Rocking 
curve attachments, mirror ...). For few years, we got at random 
positionning errors. During scans, the motors never reach a software 
understandable value (or never even go to it). This started originally 
on the Z-micrometer control, and shifted to omega more recently. 
Rebooting the whole stuff is actually not everytime enough to 
reinitialise the instrument. After some maintainance days, the proposed 
solution from Panalytical is to replace the omega circle.
I would like to get your feeback on this, whether you got similar 
problems and given solutions, if it helps or not afterwards.
I did not look at the original contract to see if Panalytical is indeed 
informing that goniometer circles are running correctly for a restricted 
lifetime, or if circle replacements should be operated on a say 10-years 
base ...


sincerely
daniel

--

--
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Co-editor Journal of Applied Crystallography, www.iucr.org
Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com
--
address: CRISMAT-ENSICAEN and IUT-Caen, 
Université de Caen Basse-Normandie, campus 2

6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateig...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
A Quantitative Texture Analysis Course:
http://qta.ecole.ensicaen.fr/
An Open Source for Crystallographic Data: the COD
http://sdpd.univ-lemans.fr/cod/
--




RE: Quantitative analysis

2008-10-29 Thread Daniel Chateigner
hi all,

not only fibre like, but single component fibre, and with the fibre axis
parrallel to the sample normal (i.e. cyclic fibre. this is very
restrictive and generally does not correspond to the real texture.
Contrarilly to what has been said here or there, the March-Dollase does
not ensure PO normalisation, but only the normalisation of this single
component, there is then no physical restriction between all hkl lines in
terms of crystal angles, which gives rise to a lot of fitting space with
unreasonable solutions either in terms of QTA or QPA.
A physically based correction for PO needs the calculation of the ODF, and
more than a single pattern to be measured. But this is the price to pay
for a corect estimate of phase amounts in textured samples.

daniel



-- 
Daniel Chateigner
Professeur
CRISMAT-ENSICAEN
Bd. M. Juin
14050 Caen, France
http://www.ecole.ensicaen.fr/~chateign/danielc/



Re: Montmorillonite cif

2008-03-15 Thread Daniel Chateigner
you can try the COD at:

http://www.crystallography.net/

daniel


 Hi,

 does anyone have a freely available structure file for montmorillonite
 (any hydration state)? Also, what is a reasonable Reference Intensity
 Ratio for it? The only ICSD entry has an RIR of over 23, so does
 vermiculite. Why is that so high?

 Thank you,
 Maria Chrysochoou




-- 
Daniel Chateigner
Professeur
CRISMAT-ENSICAEN
Bd. M. Juin
14050 Caen, France
http://www.ecole.ensicaen.fr/~chateign/danielc/



X-ray Symposium, EMRS Fall Meeting 2007

2007-03-07 Thread Daniel Chateigner

Dear Colleagues,

We would like to invite you to participate to the *symposium H: Current 
Trends in Optical and X-ray Metrology of Advanced Materials and Devices 
II* in 2007 E-MRS Fall Meeting, 17th-21st of September 2007 Warsaw, Poland


Abstract deadline is May 14th, 2007

For any additional information see Conference web-site: 
http://www.e-mrs.org/meetings/fall2007/

We kindly ask you to forward this message to your contact group.

This E-MRS symposium is aimed to:

-  give an overview of the current status of optical and x-ray 
metrology for materials characterization and quality assurance of thin 
films, layer-structured materials, and one-dimensional nanomaterials, 
with a particular emphasis on state-of-the-art metrology


-  promote and encourage the interaction between academic and 
industrial research (instrument manufacture, IC and optoelectronics 
industry and materials suppliers) to address scientific and 
technological challenges associated with the improvement of standard 
analytical methods and qualification of newer techniques.


First we would like to highlight the trends and advances in the 
techniques of optical and X-ray metrology for thin film materials, 
nanowires and nanotubes and secondly, we will address the application of 
such techniques to the study of thin-layered, wide band gap nitrides and 
functional oxide films (high-k dielectrics, ferroelectrics, ZnO and 
novel p-type transparent conductive oxides), as well as nanotubes and 
nanowires based on these materials.


As manufacturing processes become more complicated, it is imperative to 
employ in-situ metrology; this is particularly true in the 
microelectronics and micro-systems industry, such as compound 
semiconductor electronics, photonics, MEMS and sensors.


Among the various X-ray-based methods, standard X-ray diffractometry, 
X-ray reflectivity and diffuse scattering are acquiring an increasing 
relevance for characterization of materials and devices in academic and 
industrial laboratories, since these techniques are rapid, high 
resolution, non-destructive and non-contacting. In addition, the 
availability of high brilliance X-ray Synchrotron sources and the recent 
development of new X-ray scattering techniques offers new opportunities 
for non-destructive characterization of microstructures and the unique 
opportunity of characterization of micrometer-sized (or smaller) objects.


The current trends in optical metrology mainly concern spectroscopic 
ellipsometry (SE), polarisation and modulation spectroscopy, anisotropic 
reflectance and Near Field Optical Microscopy (nanoRaman).
Both optical and X-ray related techniques have gained considerable 
interest in the last decade and are currently involved in the 
characterization of thin film materials and nanomaterials.  In this 
symposium, these methods will be discussed with particular attention 
paid to their application, as well as their limitations and 
complementarities.


On behalf the organisers,
Olivier Durand

THALES Research  Technology France
Route Départementale 128
F-91767 Palaiseau cedex

Phone : +33(0)1 69 41 57 78
Fax: +33(0)1 69 41 57 38

Courriel /e-mail : [EMAIL PROTECTED]

--

--
Daniel Chateigner
Professeur
Co-editor Journal of Applied Crystallography, www.iucr.org
Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com
--
address: CRISMAT-ENSICAEN and IUT-Caen, 
Université de Caen Basse-Normandie, campus 2

6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
[EMAIL PROTECTED]
http://www.ecole.ensicaen.fr/~chateign/danielc/
--
A Quantitative Texture Analysis Course:
http://qta.ecole.ensicaen.fr/
An Open Source for Crystallographic Data: the COD
http://sdpd.univ-lemans.fr/cod/
--




Re: XPRESS access mechanism

2005-07-05 Thread Daniel Chateigner
 I also share Daniel's concerns about future access to the older machines,
 and I am sure that he would encourage ILL user's to respond to the ILL's

do !  just was not awared ths had been posted !
danel

 invitation to comment on our proposed future policy, set out on:
 http://www.ill.fr/pages/science/review.html

 Alan.

 ___
 Dr Alan Hewat, ILL Grenoble, FRANCE  [EMAIL PROTECTED] fax (33) 
 4.76.20.76.48
 (33) 4.76.20.72.13 (.26 Mme Guillermet)
 http://www.ill.fr/dif/AlanHewat.htm
 ___




-- 
Daniel Chateigner
Professeur
CRISMAT-ENSICAEN
Bd. M. Juin
14050 Caen, France
http://www.ecole.ensicaen.fr/~chateign/danielc/



Re: request

2005-04-27 Thread Daniel Chateigner
Well,

if someones asks me via the Rietveld or other list, something in one of my
papers, I have two solutions:
- I answer without sending a pdf, and this takes time, including research
time necessary to write papers that will serve and be used by fee-based
databases
6 I send a pdf

no matter if through the Rietveld list or not, which should be
consortiumly agreed, but I'll send him the pdf

daniel

 All,

 At 11:34 AM 4/20/2005 -0400, you wrote:
I think this issue of access to journals (especially commercial ones that
tend to be more expensive) for scientists in developing countries is an
important one to address and discuss (and solve!)

 I hardly disagree!

, just perhaps the Rietveld list is not the proper forum.

 This is certainly not the correct forum for (continuous) provision of said
 resources; but it is perhaps not an inappropriate one to discuss how to
 address the problem.

 Regards,

 Jim


S

Mutta Venkata Kamalkar (pBSc) wrote:

That was just a request. No more requests in future. Accept my apology
for the inconvinience caused.
regards
venkat
+++
M Venkata Kamalakar
Junior Research Fellow,
S.N.Bose.National Centre for Basic Sciences,
Block-JD, Sector-3, Salt Lake,
Kolkata, Pin: 700 098.
Phone no: 033 23355705/6/7/8 Extn: 404, 104, 301.
+++
-- Original Message ---
From: Mutta Venkata Kamalkar (pBSc) [EMAIL PROTECTED]
To: rietveld_l@ill.fr
Sent: Wed, 20 Apr 2005 17:25:53 +0630

Dear all,

Can anyone please send me the following paper.

Ferroelectrics
   Publisher:   Taylor  Francis
   Volume:   Volume 306 / 2004
   Pages:   95 - 109
   URL:   Linking Options
   DOI:   10.1080/00150190490458437

Glass­Ceramic­Metal Nanocomposites Containing a Ferroelectric Phase

A. DAN A1, T. K. KUNDU A2, B. SATPATI A3, P. V. SATYAM A3, D.
 CHAKRAVORTY A4

It very essential and our institute doesn't subscribe it.

Thankyou

venkat

+++
M Venkata Kamalakar
Junior Research Fellow,
S.N.Bose.National Centre for Basic Sciences,
Block-JD, Sector-3, Salt Lake,
Kolkata, Pin: 700 098.
Phone no: 033 23355705/6/7/8 Extn: 404, 104, 301.
+++
--- End of Original Message ---


--
Prof. Simon Billinge
Department of Physics and Astronomy
4268 Biomed. Phys. Sciences Building
Michigan State University
East Lansing, MI 48824
tel: +1-517-355-9200 x2202
fax: +1-517-353-4500
email: [EMAIL PROTECTED]
home: http://www.totalscattering.org/



 James P. Cline  [EMAIL PROTECTED]
 Ceramics Division   Voice (301) 975
 5793
 National Institute of Standards and Technology  FAX (301) 975 5334
 100 Bureau Dr. stop 8520
 Gaithersburg, MD 20899-8523USA





-- 
Daniel Chateigner
Professeur
CRISMAT-ENSICAEN
Bd. M. Juin
14050 Caen, France
http://www.ecole.ensicaen.fr/~chateign/danielc/



layered clay minerals

2001-04-21 Thread Daniel Chateigner

Dear Ana,

Generally, as many of the contributors of this list said, smectites are
only partly crystallised (sometimes turbostratic). Means you may observe
nice 00L peaks, and diffusion bands along HK0 lines. These latters should
be approached using appropriate formalism, actually I think not implemented
in usual programs. You could find out how this formalism works, reading
Dritz and Tchoubar books on the subject. On perfect powders, we (I and A.
Manceau and B. Lanson in Grenoble, LGIT) could simulate diagrams like this
using their formalism, taking account of bimodal compositional faults. Now
on top of this, as in our case, a strong preferred orientation is also
present in the sample. In these cases, we found useful to combine polarised
EXAFS experiments with Quantitative Texture Analysis in order to sort out
structural details. 
Please see on my personal web page, I have placed pdf files on this subject.

daniel



Quantitative Texture Analysis Internet Course:
http://pecdc.univ-lemans.fr/qta/

--
Daniel Chateigner
LPEC, UMR-CNRS 06087, Universit du Maine-Le Mans
http://pecdc.univ-lemans.fr/lpec.html
av. O. Messiaen, BP535 72085 Le Mans cedex
Tel prof: 33 (0) 243833268
Fax:  33 (0) 243833518 
http://www.univ-lemans.fr/~dchat/danielc/daniel.htm

---

--- World Directory of Crystallographers and concerned
scientists -
fill the form at: http://www.univ-lemans.fr/~dchat/wdc10/state.htm
A web-based "Powder Structure Determination" course:
http://sdpd.univ-lemans.fr/course/







RE: Most cited powder diffraction papers

2001-03-28 Thread Daniel Chateigner

I agree on Alan's remark Armel,

and also on superconductor-related papers that could have artificially high
levels of citation. It will be very hard however to satisfy everybody
without putting all the citations about crystallography ! There are so many
fields and so many interests.

We may have a look at Cambridge (UK) Univ, before hiring someone they
consult (if I remember correctly, that's what I heard from Ekhard Salje), a
procedure that weights for the journal rank. Well, a beginning already !

daniel




Re: structure required

2001-02-08 Thread Daniel Chateigner

someone could give me the structure of silicon carbide 6H ? please?

daniel



Quantitative Texture Analysis Internet Course:
http://pecdc.univ-lemans.fr/qta/

--
Daniel Chateigner
LPEC, UMR-CNRS 06087, Universit du Maine-Le Mans
http://pecdc.univ-lemans.fr/lpec.html
av. O. Messiaen, BP535 72085 Le Mans cedex
Tel prof: 33 (0) 243833268
Fax:  33 (0) 243833518 
http://www.univ-lemans.fr/~dchat/danielc/daniel.htm

---

--- World Directory of Crystallographers and concerned
scientists -
fill the form at: http://www.univ-lemans.fr/~dchat/wdc10/state.htm
A web-based "Powder Structure Determination" course:
http://sdpd.univ-lemans.fr/course/