Combined Analysis Workshop, Caen, France
Dear All, We now know that our Workshop can be organized on-site, thanks to progressive borders reopening and vaccinations. The 11th session of the Combined Analysis Workshop will take place in Caen France from July 5th to July 9th, 2021. The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique, Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, Using the MAUD software... To get a first taste, visit the Workshop website: http://www.ecole.ensicaen.fr/~chateign/formation/ Hope to welcome to in Caen, still are remaining few places. Daniel Chateigner, Stéphanie Gascoin, Luca Lutterotti -- ------ Daniel Chateigner Professeur Normandie Universite www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/ -- Address: CRISMAT-ENSICAEN and IUT-Caen, Universite de Caen Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 daniel.chateig...@ensicaen.fr -- Open Databases: Material Properties Open Database (MPOD): mpod.cimav.edu.mx Crystallography Open Database (COD): www.crystallography.net/cod/ Theoretical (TCOD): www.crystallography.net/tcod/ Predicted (PCOD): www.crystallography.net/pcod/ Raman Open Database (ROD): solsa.crystallography.net/rod/ Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/ -- ++ Please do NOT attach files to the whole list Send commands to eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
Combined Analysis Workshop in Caen, France
Dear Colleagues, We are organizing the 11^th workshop on Combined Analysis Using Ray Scattering**, July 5^th - 9^th 2021, in Caen, France. We hope the worldwide situation evolves positively so that this workshop can take place. More details here: Agenda: http://www.ecole.ensicaen.fr/~chateign/formation/agendas/Flyer-workshop-CA-2021.pdf <http://www.ecole.ensicaen.fr/~chateign/formation/Programs/2020_CombinedAnalysis_flyer.pdf>Program: http://www.ecole.ensicaen.fr/~chateign/formation/Programs/2021-program_11th_workshop.pdf * _Registration links:_ French:https://www.azur-colloque.fr/DR19/inscription/inscription/55/fr <https://www.azur-colloque.fr/DR19/inscription/inscription/55/fr> English: https://www.azur-colloque.fr/DR19/inscription/inscription/55 <https://www.azur-colloque.fr/DR19/inscription/inscription/55> * _Registration deadline_ : *June 15^th *, 2021 To get more insights about Combined Analysis visit the web site: http://www.ecole.ensicaen.fr/~chateign/formation/ <http://www.ecole.ensicaen.fr/~chateign/formation/> Sincerely, Stéphanie Gascoin, Daniel Chateigner, Luca Lutterotti */What is the Combined Analysis approach?/* Quickly, the Combined Analysis methodology is an approach allowing to extract as maximum information as possible from scattering patterns [preferred orientations (ODF, pole figures), residual stresses (homogenisation models of elastic tensors), microstructures (iso- anisotropic sizes, microstrains, distributions, faults), phase analysis (crystalline or mixtures of crystallines/amorphous), structures, thickness and roughness (specular reflectivity)], x-ray reflectivity and fluorescence. It allows individual algorithms to interact with each other to reach a global minimum for simultaneously all the refined parameters. The Rietveld method serves the core of the methodology, and all is integrated in the user-friendly software MAUD. Each analysis type will be first described, then integrated in the combined approach, and each day of the workshop will be dedicated to one or two characterisation type (texture, reflectivity ...) and to its practice. Mornings will consist of courses, afternoons of practical training on your own computers. All the materials will be downloadable prior to the workshop. People working on real materials (time-consuming or hard to elaborate, rare, subjected to change under grinding or impossible to grind, films or multilayers, ...), are a priori interested by this workshop. Personal examples can be brought to Caen, might be measured before or during the workshop. -- ---------- Daniel Chateigner Professeur Normandie Universite www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/ -- Address: CRISMAT-ENSICAEN and IUT-Caen, Universite de Caen Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 daniel.chateig...@ensicaen.fr -- Open Databases: Material Properties Open Database (MPOD): mpod.cimav.edu.mx Crystallography Open Database (COD): www.crystallography.net/cod/ Theoretical (TCOD): www.crystallography.net/tcod/ Predicted (PCOD): www.crystallography.net/pcod/ Raman Open Database (ROD): solsa.crystallography.net/rod/ Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/ -- ++ Please do NOT attach files to the whole list Send commands to eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
Re:
Dear Shay, The last MAUD version is here, please first check if you run the latest: http://maud.radiographema.com Examples of configured experiments including layered samples are also available at: http://www.ecole.ensicaen.fr/~chateign/formation/ In the meantime, can you send your .par file for checking ? sincerely daniel Le 02/05/2020 à 13:20, Shay Tirosh a écrit : Dear Rietvelders Specifically to the MAUD community. Some features in MAUD are not working properly (in my case). For example: 1. I wish to model to layers. The upper layer is a film contains a mixture of three phases. Beneath a layer (film) with a single phase. However, it seems that modeling using layers does not work. Specifically editing layers does not allows picking a few phases in a single layer. And It is impossible to pick different phases in different layers. MAUD let me define two layers, each contains all phases (four phases). I tried to "cheat" and fix the volume fraction flowing my model and it doesn't work. MAUD does not count layer 2 even if I nullify the thickness of layer 1. 2. I am unable to create multiple samples (add object does not work). 3. The appearance of all curves in the plot are all black. The data set color and the computed CIF are black. Also, the color of the corresponding labeled phases are all black with no option to change it. Please note that problem 3 has been eliminated in case I am running a similar project on a different computer (identical MAUD version). 1. Can you comment? 2. Any Suggestions? Thank you from advance Shay -- _ Dr. Shay Tirosh Institute for Nanotechnology & Advanced Materials Bar Ilan University Ramat Gan, 52900 Israel Phone: +972-(0)30-531-7320 Mobile: +972-(0)54-8834533 Email: stiro...@gmail.com <mailto:stiro...@gmail.com> _ ++ Please do NOT attach files to the whole list Send commands to eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++ -- ---------- Daniel Chateigner Professeur Normandie Universite www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/ -- Address: CRISMAT-ENSICAEN and IUT-Caen, Universite de Caen Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 daniel.chateig...@ensicaen.fr -- Open Databases: Material Properties Open Database (MPOD): mpod.cimav.edu.mx Crystallography Open Database (COD): www.crystallography.net/cod/ Theoretical (TCOD): www.crystallography.net/tcod/ Predicted (PCOD): www.crystallography.net/pcod/ Raman Open Database (ROD): solsa.crystallography.net/rod/ Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/ -- ++ Please do NOT attach files to the whole list Send commands to eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
Re: pdf cards for Li2SiO3
Dear Angel, You have the cif file on COD here: http://www.crystallography.net/cod/2310662.html sincerely daniel Le 13/04/2020 à 11:35, Angel L. Ortiz a écrit : Dear colleagues, Could any of you email me the pdf cards for Li2SiO3? Thanks Angel -- Angel L. Ortiz, PhD Associate Professor (Reader) Materials Science and Engineering Department of Mechanical, Energy and Materials Engineering University of Extremadura, Badajoz 06006, Spain (34) 924289600 Ext:86726 (Phone) (34) 924289601 (Fax) http://materiales.unex.es/miembros/personal/al-ortiz/index.html --- ++ Please do NOT attach files to the whole list Send commands to eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++ -- -- Daniel Chateigner Professeur Normandie Universite www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/ -- Address: CRISMAT-ENSICAEN and IUT-Caen, Universite de Caen Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 daniel.chateig...@ensicaen.fr -- Open Databases: Material Properties Open Database (MPOD): mpod.cimav.edu.mx Crystallography Open Database (COD): www.crystallography.net/cod/ Theoretical (TCOD): www.crystallography.net/tcod/ Predicted (PCOD): www.crystallography.net/pcod/ Raman Open Database (ROD): solsa.crystallography.net/rod/ Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/ -- ++ Please do NOT attach files to the whole list Send commands to eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
New Panalytical x-ray tubes ?
Dear Colleagues, We recently got the information that, on Panalytical instruments, new x-ray tubes will be produced that will require new high voltage cables ... Consequently, the new tubes will be more expensive, without accounting for the price of the high-voltage cable, per instrument. This will in return, except for larger tube lifetimes, condition our future acquisitions. Have some of you heard about this or is it only a rumor ? cheers daniel -- -- Daniel Chateigner Professeur Normandie Universite www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: www.ecole.ensicaen.fr/~chateign/formation/ -- Address: CRISMAT-ENSICAEN and IUT-Caen, Universite de Caen Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr -- Open Databases: Material Properties Open Database (MPOD): mpod.cimav.edu.mx Crystallography Open Database (COD): www.crystallography.net/cod/ Theoretical (TCOD): www.crystallography.net/tcod/ Predicted (PCOD): www.crystallography.net/pcod/ Raman Open Database (ROD): solsa.crystallography.net/rod/ Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/ -- ++ Please do NOT attach files to the whole list <alan.he...@neutronoptics.com> Send commands to <lists...@ill.fr> eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
[no subject]
Dear Colleagues, As you certainly know, the UN ban treaty negotiations will start on March 27. This is one important step towards nuclear weapons abolition. The Future of Life Institute has issued an open letter supporting the negotiations: https://futureoflife.org/nuclear-open-letter/ It is also copied in this email at the bottom. The open letter has been signed already by more than 2000 scientists of the STEM fields. We ask you to sign and spread this information before March 27. */An Open Letter from Scientists in Support of the UN Nuclear Weapons Negotiations/* /Nuclear arms are the only weapons of mass destruction not yet prohibited by an international convention, even though they are the most destructive and indiscriminate weapons ever created. We scientists bear a special responsibility for nuclear weapons, since it was scientists who invented them and discovered that their effects are even more horrific than first thought. Individual explosions can obliterate cities, radioactive fallout can contaminate regions, and a high-altitude electromagnetic pulse may cause mayhem by frying electrical grids and electronics across a continent. The most horrible hazard is a nuclear-induced winter, in which the fires and smoke from as few as a thousand detonations might darken the atmosphere enough to trigger a global mini ice age with year-round winter-like conditions. This could cause a complete collapse of the global food system and apocalyptic unrest, potentially killing most people on Earth – even if the nuclear war involved only a small fraction of the roughly 14,000 nuclear weapons that today’s nine nuclear powers control. As Ronald Reagan said: “A nuclear war cannot be won and must never be fought.”/ / Unfortunately, such a war is more likely than one may hope, because it can start by mistake, miscalculation or terrorist provocation. There is a steady stream of accidents and false alarms that could trigger all-out war, and relying on never-ending luck is not a sustainable strategy. Many nuclear powers have larger nuclear arsenals than needed for deterrence, yet prioritize making them more lethal over reducing them and the risk that they get used./ /But there is also cause for optimism. On March 27 2017, an unprecedented process begins at the United Nations: most of the world’s nations convene to negotiate a ban on nuclear arms, to stigmatize them like biological and chemical weapons, with the ultimate goal of a world free of these weapons of mass destruction. We support this, and urge our national governments to do the same, because nuclear weapons threaten not merely those who have them, but all people on Earth./ Thanks for your support. Best regards, Lucas Wirl -- INES Marienstr. 19/20 10117 Berlin www.inesglobal.net <http://www.inesglobal.net> -- -- Daniel Chateigner Professeur Normandie Universite http://www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: http://www.ecole.ensicaen.fr/~chateign/formation/ Advisory Board: Zeitschrift für Kristallographie -- Address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr -- Open Databases: Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/ Material Properties Open Database (MPOD): http://www.materialproperties.org/ Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/ Theoretical (TCOD): http://sdpd.univ-lemans.fr/cod/tcod/ Predicted (PCOD): http://sdpd.univ-lemans.fr/cod/pcod/ -- ++ Please do NOT attach files to the whole list <alan.he...@neutronoptics.com> Send commands to <lists...@ill.fr> eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
Re: Asking for Cif file.
Dear Gili, You can get the Bi2La2Ti3O12 phase from the COD, number 1532556 daniel Le 19/10/2015 10:32, גילי כהן תאגורי a écrit : Hi all, I'll really appreciate if someone can give me the cif file of Bi3.25La0.75Ti3O12 ( ICSD No. 150091). Thanks in advance, Gili Gili Taguri Bar Ilan institute of Nanotechnology and advanced Material (BINA) Bar Ilan Universtiy ++ Please do NOT attach files to the whole list <alan.he...@neutronoptics.com> Send commands to <lists...@ill.fr> eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++ -- ------ Daniel Chateigner Professeur, Université de Caen Basse-Normandie http://www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: http://www.ecole.ensicaen.fr/~chateign/formation/ Advisory Board: Zeitschrift für Kristallographie -- Address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr -- Open Databases: Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/ Material Properties Open Database (MPOD): http://www.materialproperties.org/ Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/ Theoretical (TCOD): http://sdpd.univ-lemans.fr/cod/tcod/ Predicted (PCOD): http://sdpd.univ-lemans.fr/cod/pcod/ -- ++ Please do NOT attach files to the whole list <alan.he...@neutronoptics.com> Send commands to <lists...@ill.fr> eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
Postdoc position available at CRISMAT
Dear All, Please find information about a 4-years postdoc position, targetted opening period Jan 2016, at CRISMAT-Caen: http://www.ecole.ensicaen.fr/~chateign/projets/SOLSA/Post-doc_fellow-SOLSA_DC.pdf sincerely daniel -- -- Daniel Chateigner Professeur, Université de Caen Basse-Normandie http://www.ecole.ensicaen.fr/~chateign/danielc/ -- Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Workshops on Combined Analysis: http://www.ecole.ensicaen.fr/~chateign/formation/ Advisory Board: Zeitschrift für Kristallographie -- Address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr -- Open Databases: Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/ Material Properties Open Database (MPOD): http://www.materialproperties.org/ Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/ Theoretical (TCOD): http://sdpd.univ-lemans.fr/cod/tcod/ Predicted (PCOD): http://sdpd.univ-lemans.fr/cod/pcod/ -- ++ Please do NOT attach files to the whole list <alan.he...@neutronoptics.com> Send commands to <lists...@ill.fr> eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
Re: PO corrections in trigonal space groups?
Hi Matthew,
You would perhaps prefer physically meaningfull PO correction using
standard functions, at disposal in Maud. If you can give me an ascii
double column of your data I'll give it a trial.
daniel
Le 25/03/2014 11:43, Matthew Rowles a écrit :
Hi all
I have a sample containing a fraction of calcite. My research tells me
that calcite cleaves on {10-11}.
How can I express this as an hkl for the March-Dollase PO correction?
By inspection, {104} is the direction that orients. Is that correct?
How can I derive that?
Thanks
Matthew Rowles
--
http://www.ecole.ensicaen.fr/~chateign/danielc/
Address:
IUT-Caen Université de Caen Basse-Normandie and
CRISMAT-ENSICAEN
6 Bd. M. Juin, 14050 Caen
The Crystallography Open Database: www.crystallography.net
The Materials Property Open Database: http://www.materialproperties.org/
Combined Analysis using rays: http://iste.co.uk/index.php?f=xACTION=Viewid=359
++
Please do NOT attach files to the whole list alan.he...@neutronoptics.com
Send commands to lists...@ill.fr eg: HELP as the subject with no body text
The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/
++
5th Edition of MAUD workshop in Caen, France June 30th to July 4th, 2014
Dear All, We are pleased to announce the 5^th Edition of the MAUD workshop in Caen, France: *_Combined Analysis Using X-ray and Neutron Scattering_*, June 30th to July 4th, 2014 Registration deadline : June 15, 2014- Official language: English The Combined Analysis methodology is an approach allowing to extract as maximum information as possible from x-ray, neutron and electron scattering patterns, x-ray specular reflectivity curves and x-ray fluorescence spectra: -preferred orientations : ODF, pole figures, -residual stresses: homogeneisation models of elastic tensors, -microstructures: iso- anisotropic sizes and shapes, microstrains, distributions, faults, -phase analysis: crystalline or mixtures of crystallines/amorphou), -structures, compositions -layers' thickness, roughness ... It uses algorithmics allowing individual algorithms to interact with each others to reach a global minimum for simultaneously refine all parameters of interest. The Rietveld method serves the core of the methodology, and all is integrated in the user-friendly MAUD software, this latter being the used software all along the workshop. Each analysis type will be first described, then integrated in the combined approach. Each day will be dedicated to one or two characterization types (texture, reflectivity...) and to its practice. Mornings will consist on theoretical sessions, and afternoons of practical rsessions on computers. We encourage attendees to bring their own computers to ease future use when back home. All the educational materials will be downloadable prior to the workshop. People working on time-consuming or hard to elaborate, rare, subjected to change under grinding or impossible to grind, films or multilayers... materials should be interested in this workshop. Personal examples could be brought to Caento be discussed and/or analyzed before or during the workshop. Please consult us on this subject for preliminary agreement of the organizers. WARNING: we do privilege quality to quantity ! This would not be reasonable to accept more than 30 participants, pedagogically speaking. First arrived first served ! For more information about the content, detailed courses, exercises and tutorials from this Workshop series, please visit: http://www.ecole.ensicaen.fr/~chateign/formation/ http://www.ecole.ensicaen.fr/%7Echateign/formation/ For more information about the workshop, please contact Inel i...@inel.fr mailto:i...@inel.fr or visit http://www.inel.fr/en/news-events/workshop-2014-rietveld http://www.inel.fr/en/news-events/workshop-2013-rietveld Best regards. Eric Berthier, Inel company, Artenay - France Daniel Chateigner, Caen University - France Luca Lutterotti, Trento University - Italy -- -- Daniel Chateigner Professeur, Université de Caen Basse-Normandie Editor: Combined Analysis, Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html Co-editor Journal of Applied Crystallography, www.iucr.org Workshops on Combined Analysis: http://www.ecole.ensicaen.fr/~chateign/formation/ -- address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr http://www.ecole.ensicaen.fr/~chateign/danielc/ -- Full-Profile Search-Match: http://cod.iutcaen.unicaen.fr/ Material Properties OIpen Database (MPOD): http://www.materialproperties.org/ Crystallography Open Database (COD): http://sdpd.univ-lemans.fr/cod/ -- ++ Please do NOT attach files to the whole list alan.he...@neutronoptics.com Send commands to lists...@ill.fr eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/ ++
Combined Analysis Workshop
Dear Colleagues, We are organising the following workshop in Caen, France: *Combined Analysis Using X-ray and Neutron Scattering* June 28th - July 2nd, 2010, Caen (France) Registration deadline : June 1st, 2010 Please visit the web site: http://www.inel.fr/news/page.asp?n=39 The Combined Analysis methodology is an approach allowing to extract as maximum information as possible from scattering patterns [preferred orientations (ODF, pole figures), residual stresses (homogeneisation models of elastic tensors), microstructures (iso- anisotropic sizes, microstrains, distributions, faults), phase analysis (crystalline or mixtures of crystallines/amorphous), structures, thickness and roughness (specular reflectivity)]. It uses algoritmics allowing individual algorithms to interact with each others to reach a global minimum for simulataneously all the refined parameters. The Rietveld method serves the core of the methodology, and all is integrated in the user-friendly software MAUD. Each analysis type will be first described, then integrated in the combined approach, and each day of the workshop will be dedicated to one or two characterisation type (texture, reflectivity ...) and to its practice. Mornings will consist of courses, afternoons of practical training on computers. Participants are encouraged to bring their own computers to easy future use when back home. All the materials will be downloadable prior to the workshop. People working on real materials (time-consuming or hard to elaborate, rares, subjected to change under grinding or impossible to grind, films or multilayers, ...), are a priori interested by this workshop. Personal exemples can be brought to Caen, can be measured before or during the workshop. sincerely daniel -- -- Daniel Chateigner Professeur, Université de Caen Basse-Normandie Co-editor Journal of Applied Crystallography, www.iucr.org Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com -- address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr http://www.ecole.ensicaen.fr/~chateign/danielc/ -- A Quantitative Texture Analysis Course: http://qta.ecole.ensicaen.fr/ An Open Source for Crystallographic Data: the COD http://sdpd.univ-lemans.fr/cod/ --
Re: diffraction patterns or spectra
shall we say spectra is more general then ? since monocinetic measurements are never perfectly mono ? daniel Radovan Cerny radovan.ce...@unige.ch a écrit : For single energy (single wavelength) experiment the correct term is diffraction pattern. For multi energy (energy dispersive, ToF) experiment, the correct term is diffraction spectrum. From http://www.etymonline.com/ : pattern (n.) 1324, the original proposed to imitation; the archetype; that which is to be copied; an exemplar [Johnson], from O.Fr. patron, from M.L. patronus (see patron). Extended sense of decorative design first recorded 1582, from earlier sense of a patron as a model to be imitated. The difference in form and sense between patron and pattern wasn't firm till 1700s. Meaning model or design in dressmaking (especially one of paper) is first recorded 1792, in Jane Austen. Verb phrase pattern after take as a model is from 1878. spectrum 1611, apparition, specter, from L. spectrum appearance, image, apparition, from specere to look at, view (see scope (1)). Meaning band of colors formed from a beam of light first recorded 1671. Spectroscope (1861) is a hybrid, with Gk. -skopion, from skopein to look at, examine, which is from the same PIE root as spectrum. specter Radovan Lubomir Smrcok a écrit : Spectrum: from Latin spectrum appearance, specter, from specere to look, look at Lubo On Thu, 11 Feb 2010, amar...@chimica.unige.it wrote: Dear all, I see that in scientific literature (also in high-impact factor scientific journals) the diffraction patterns are often referred to as diffraction spectra. But we all know that diffraction is not a spectroscopic technique. Should we pay more attention on this aspect when we write or refer a paper? What about? Best regards, Alberto -- Radovan Cerny Laboratoire de Cristallographie 24, quai Ernest-Ansermet CH-1211 Geneva 4, Switzerland Phone : [+[41] 22] 37 964 50, FAX : [+[41] 22] 37 961 08 mailto : radovan.ce...@unige.ch URL: http://www.unige.ch/sciences/crystal/cerny/rcerny.htm Ce message a ete genere avec le webmail Horde-IMP de l'ENSICAEN.
Re: Preferred orientation question
Dear Ross, I presume on the flat sample you measured regular theta-2theta diagrams, then only probed those planes parallel to the sample plane. In such a situation, you do not probe correctly the texture, and all the models you could envisage are just giving back parameters that have been refined on non-physic grounds. Harmonics will render a very nice fit, just adding on the number of parameters in the development. Measuring the full spectra in order to resolve structural parameters of a textured sample requires that you acquire data in more than few sample orientations, then the quantitative textural information brings orientational physics in the Rietveld fits (http://www.ecole.ensicaen.fr/~chateign/texture/combined.pdf). For this you need to put the sample in a 4-circle diffractometer. cheers daniel Ross H Colman a écrit : Dear All, Could anybody help me with a question I have related to preferred orientation? I have collected some spectra of a sample, on a D4 using flat plate geometry, that I suspect is showing preferred orientation effects. I was under the impression that a way of testing for this is to re-pack the sample, re-run and compare the spectra, as the level of preferred orientation should change between packings and so the spectra should differ slightly. Despite re-packing and comparing spectra from up to 8 scans the spectra overlay perfectly (within noise). This suggests to me that the refinement residuals are probably not due to preferred orientation. I am using Topas to refine the data and despite the comment above, the residuals seem best fitted using a spherical harmonic-prefered orientation model. I have also tried using other parameters to fit the residuals such as the occupancy of some of the sites, using anisotropic displacement parameters or anisotropic broadening effects, but the SH-PO fits best and seems the most physically reasonable treatment. As a test, I have also run the sample in capillary transmission geometry on another instrument, and the refined value of the SH-PO parameter is reduced. This seems to confirm that PO is the problem, but the question I have is how effective the re-packing comparison method is for confirming PO? If I see no difference in the spectra does it confirm that PO is NOT the problem or can I still have PO effects that are very repeatable upon repeat packing? If PO is not the problem in this case, are there any other structural or instrument effects that could lead to refinement residuals that would be well treated with a SH-PO model? Thank you all very much for any information or light you can shed on the subject. Ross Colman -- -- Daniel Chateigner Professeur, Université de Caen Basse-Normandie Co-editor Journal of Applied Crystallography, www.iucr.org Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com -- address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr http://www.ecole.ensicaen.fr/~chateign/danielc/ -- A Quantitative Texture Analysis Course: http://qta.ecole.ensicaen.fr/ An Open Source for Crystallographic Data: the COD http://sdpd.univ-lemans.fr/cod/ --
Re: Thickness measurement
Dear François, if the layers are say more than 300nm, go there: http://www.ecole.ensicaen.fr/~chateign/pdf/ICOTOM13CPSQTA.pdf if lower, use reflectivity. Why don't you ask your, fully equipped, neighbours ? Just few steps in the corridor, the lab aside ... or send me your samples ! ;-) daniel Francois Goutenoire a écrit : Dear Rietveld Users, I am currently working on thin layers deposit by soft chemistry on different substrates (Al2O3, Copper, ….) In order to analyse these samples, I am using a D8 (Bruker) with a collimator + point detector. We do not have any mirror to produce an intense parallel beam. We just used some primary slit, in order to give a less divergent beam. For the moment, I am making detector scan ( from 10° to 70° 2 theta) with omega fixed ( from 1 to 5°). We can have identification of the thin layer + the substrate. I would like to have a rough idea of the thickness of the layer. I would like to do such experiment with the decrease of the intensity of a substrate peak versus the omega angle, and make a calculation with the decrease of the intensity versus the omega angle. After, I will make an hypothesis of the composition and the compact density. My first test give nothing !!! Does anyone have an idea, or even some reference text on such device (powder diffractometer + collimator + point detection) and applications. Best Whishes, François Goutenoire. -- -- Daniel Chateigner Professeur, Université de Caen Basse-Normandie Co-editor Journal of Applied Crystallography, www.iucr.org Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com -- address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr http://www.ecole.ensicaen.fr/~chateign/danielc/ -- A Quantitative Texture Analysis Course: http://qta.ecole.ensicaen.fr/ An Open Source for Crystallographic Data: the COD http://sdpd.univ-lemans.fr/cod/ --
X'PERT PRO
Dear all, We bought a X'PERT PRO 14 years ago with all the optics possibilities at that time (Bartels, Hybrids, Texture, Solllers of all kinds, Rocking curve attachments, mirror ...). For few years, we got at random positionning errors. During scans, the motors never reach a software understandable value (or never even go to it). This started originally on the Z-micrometer control, and shifted to omega more recently. Rebooting the whole stuff is actually not everytime enough to reinitialise the instrument. After some maintainance days, the proposed solution from Panalytical is to replace the omega circle. I would like to get your feeback on this, whether you got similar problems and given solutions, if it helps or not afterwards. I did not look at the original contract to see if Panalytical is indeed informing that goniometer circles are running correctly for a restricted lifetime, or if circle replacements should be operated on a say 10-years base ... sincerely daniel -- -- Daniel Chateigner Professeur, Université de Caen Basse-Normandie Co-editor Journal of Applied Crystallography, www.iucr.org Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com -- address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 daniel.chateig...@ensicaen.fr http://www.ecole.ensicaen.fr/~chateign/danielc/ -- A Quantitative Texture Analysis Course: http://qta.ecole.ensicaen.fr/ An Open Source for Crystallographic Data: the COD http://sdpd.univ-lemans.fr/cod/ --
RE: Quantitative analysis
hi all, not only fibre like, but single component fibre, and with the fibre axis parrallel to the sample normal (i.e. cyclic fibre. this is very restrictive and generally does not correspond to the real texture. Contrarilly to what has been said here or there, the March-Dollase does not ensure PO normalisation, but only the normalisation of this single component, there is then no physical restriction between all hkl lines in terms of crystal angles, which gives rise to a lot of fitting space with unreasonable solutions either in terms of QTA or QPA. A physically based correction for PO needs the calculation of the ODF, and more than a single pattern to be measured. But this is the price to pay for a corect estimate of phase amounts in textured samples. daniel -- Daniel Chateigner Professeur CRISMAT-ENSICAEN Bd. M. Juin 14050 Caen, France http://www.ecole.ensicaen.fr/~chateign/danielc/
Re: Montmorillonite cif
you can try the COD at: http://www.crystallography.net/ daniel Hi, does anyone have a freely available structure file for montmorillonite (any hydration state)? Also, what is a reasonable Reference Intensity Ratio for it? The only ICSD entry has an RIR of over 23, so does vermiculite. Why is that so high? Thank you, Maria Chrysochoou -- Daniel Chateigner Professeur CRISMAT-ENSICAEN Bd. M. Juin 14050 Caen, France http://www.ecole.ensicaen.fr/~chateign/danielc/
X-ray Symposium, EMRS Fall Meeting 2007
Dear Colleagues, We would like to invite you to participate to the *symposium H: Current Trends in Optical and X-ray Metrology of Advanced Materials and Devices II* in 2007 E-MRS Fall Meeting, 17th-21st of September 2007 Warsaw, Poland Abstract deadline is May 14th, 2007 For any additional information see Conference web-site: http://www.e-mrs.org/meetings/fall2007/ We kindly ask you to forward this message to your contact group. This E-MRS symposium is aimed to: - give an overview of the current status of optical and x-ray metrology for materials characterization and quality assurance of thin films, layer-structured materials, and one-dimensional nanomaterials, with a particular emphasis on state-of-the-art metrology - promote and encourage the interaction between academic and industrial research (instrument manufacture, IC and optoelectronics industry and materials suppliers) to address scientific and technological challenges associated with the improvement of standard analytical methods and qualification of newer techniques. First we would like to highlight the trends and advances in the techniques of optical and X-ray metrology for thin film materials, nanowires and nanotubes and secondly, we will address the application of such techniques to the study of thin-layered, wide band gap nitrides and functional oxide films (high-k dielectrics, ferroelectrics, ZnO and novel p-type transparent conductive oxides), as well as nanotubes and nanowires based on these materials. As manufacturing processes become more complicated, it is imperative to employ in-situ metrology; this is particularly true in the microelectronics and micro-systems industry, such as compound semiconductor electronics, photonics, MEMS and sensors. Among the various X-ray-based methods, standard X-ray diffractometry, X-ray reflectivity and diffuse scattering are acquiring an increasing relevance for characterization of materials and devices in academic and industrial laboratories, since these techniques are rapid, high resolution, non-destructive and non-contacting. In addition, the availability of high brilliance X-ray Synchrotron sources and the recent development of new X-ray scattering techniques offers new opportunities for non-destructive characterization of microstructures and the unique opportunity of characterization of micrometer-sized (or smaller) objects. The current trends in optical metrology mainly concern spectroscopic ellipsometry (SE), polarisation and modulation spectroscopy, anisotropic reflectance and Near Field Optical Microscopy (nanoRaman). Both optical and X-ray related techniques have gained considerable interest in the last decade and are currently involved in the characterization of thin film materials and nanomaterials. In this symposium, these methods will be discussed with particular attention paid to their application, as well as their limitations and complementarities. On behalf the organisers, Olivier Durand THALES Research Technology France Route Départementale 128 F-91767 Palaiseau cedex Phone : +33(0)1 69 41 57 78 Fax: +33(0)1 69 41 57 38 Courriel /e-mail : [EMAIL PROTECTED] -- -- Daniel Chateigner Professeur Co-editor Journal of Applied Crystallography, www.iucr.org Editor-in-Chief Texture, Stress and Microstructure, www.hindawi.com -- address: CRISMAT-ENSICAEN and IUT-Caen, Université de Caen Basse-Normandie, campus 2 6, Bd. M. Juin 14050 Caen, France tel: 33 (0)2 31 45 26 11 fax: 33 (0)2 31 95 16 00 [EMAIL PROTECTED] http://www.ecole.ensicaen.fr/~chateign/danielc/ -- A Quantitative Texture Analysis Course: http://qta.ecole.ensicaen.fr/ An Open Source for Crystallographic Data: the COD http://sdpd.univ-lemans.fr/cod/ --
Re: XPRESS access mechanism
I also share Daniel's concerns about future access to the older machines, and I am sure that he would encourage ILL user's to respond to the ILL's do ! just was not awared ths had been posted ! danel invitation to comment on our proposed future policy, set out on: http://www.ill.fr/pages/science/review.html Alan. ___ Dr Alan Hewat, ILL Grenoble, FRANCE [EMAIL PROTECTED] fax (33) 4.76.20.76.48 (33) 4.76.20.72.13 (.26 Mme Guillermet) http://www.ill.fr/dif/AlanHewat.htm ___ -- Daniel Chateigner Professeur CRISMAT-ENSICAEN Bd. M. Juin 14050 Caen, France http://www.ecole.ensicaen.fr/~chateign/danielc/
Re: request
Well, if someones asks me via the Rietveld or other list, something in one of my papers, I have two solutions: - I answer without sending a pdf, and this takes time, including research time necessary to write papers that will serve and be used by fee-based databases 6 I send a pdf no matter if through the Rietveld list or not, which should be consortiumly agreed, but I'll send him the pdf daniel All, At 11:34 AM 4/20/2005 -0400, you wrote: I think this issue of access to journals (especially commercial ones that tend to be more expensive) for scientists in developing countries is an important one to address and discuss (and solve!) I hardly disagree! , just perhaps the Rietveld list is not the proper forum. This is certainly not the correct forum for (continuous) provision of said resources; but it is perhaps not an inappropriate one to discuss how to address the problem. Regards, Jim S Mutta Venkata Kamalkar (pBSc) wrote: That was just a request. No more requests in future. Accept my apology for the inconvinience caused. regards venkat +++ M Venkata Kamalakar Junior Research Fellow, S.N.Bose.National Centre for Basic Sciences, Block-JD, Sector-3, Salt Lake, Kolkata, Pin: 700 098. Phone no: 033 23355705/6/7/8 Extn: 404, 104, 301. +++ -- Original Message --- From: Mutta Venkata Kamalkar (pBSc) [EMAIL PROTECTED] To: rietveld_l@ill.fr Sent: Wed, 20 Apr 2005 17:25:53 +0630 Dear all, Can anyone please send me the following paper. Ferroelectrics Publisher: Taylor Francis Volume: Volume 306 / 2004 Pages: 95 - 109 URL: Linking Options DOI: 10.1080/00150190490458437 GlassCeramicMetal Nanocomposites Containing a Ferroelectric Phase A. DAN A1, T. K. KUNDU A2, B. SATPATI A3, P. V. SATYAM A3, D. CHAKRAVORTY A4 It very essential and our institute doesn't subscribe it. Thankyou venkat +++ M Venkata Kamalakar Junior Research Fellow, S.N.Bose.National Centre for Basic Sciences, Block-JD, Sector-3, Salt Lake, Kolkata, Pin: 700 098. Phone no: 033 23355705/6/7/8 Extn: 404, 104, 301. +++ --- End of Original Message --- -- Prof. Simon Billinge Department of Physics and Astronomy 4268 Biomed. Phys. Sciences Building Michigan State University East Lansing, MI 48824 tel: +1-517-355-9200 x2202 fax: +1-517-353-4500 email: [EMAIL PROTECTED] home: http://www.totalscattering.org/ James P. Cline [EMAIL PROTECTED] Ceramics Division Voice (301) 975 5793 National Institute of Standards and Technology FAX (301) 975 5334 100 Bureau Dr. stop 8520 Gaithersburg, MD 20899-8523USA -- Daniel Chateigner Professeur CRISMAT-ENSICAEN Bd. M. Juin 14050 Caen, France http://www.ecole.ensicaen.fr/~chateign/danielc/
layered clay minerals
Dear Ana, Generally, as many of the contributors of this list said, smectites are only partly crystallised (sometimes turbostratic). Means you may observe nice 00L peaks, and diffusion bands along HK0 lines. These latters should be approached using appropriate formalism, actually I think not implemented in usual programs. You could find out how this formalism works, reading Dritz and Tchoubar books on the subject. On perfect powders, we (I and A. Manceau and B. Lanson in Grenoble, LGIT) could simulate diagrams like this using their formalism, taking account of bimodal compositional faults. Now on top of this, as in our case, a strong preferred orientation is also present in the sample. In these cases, we found useful to combine polarised EXAFS experiments with Quantitative Texture Analysis in order to sort out structural details. Please see on my personal web page, I have placed pdf files on this subject. daniel Quantitative Texture Analysis Internet Course: http://pecdc.univ-lemans.fr/qta/ -- Daniel Chateigner LPEC, UMR-CNRS 06087, Universit du Maine-Le Mans http://pecdc.univ-lemans.fr/lpec.html av. O. Messiaen, BP535 72085 Le Mans cedex Tel prof: 33 (0) 243833268 Fax: 33 (0) 243833518 http://www.univ-lemans.fr/~dchat/danielc/daniel.htm --- --- World Directory of Crystallographers and concerned scientists - fill the form at: http://www.univ-lemans.fr/~dchat/wdc10/state.htm A web-based "Powder Structure Determination" course: http://sdpd.univ-lemans.fr/course/
RE: Most cited powder diffraction papers
I agree on Alan's remark Armel, and also on superconductor-related papers that could have artificially high levels of citation. It will be very hard however to satisfy everybody without putting all the citations about crystallography ! There are so many fields and so many interests. We may have a look at Cambridge (UK) Univ, before hiring someone they consult (if I remember correctly, that's what I heard from Ekhard Salje), a procedure that weights for the journal rank. Well, a beginning already ! daniel
Re: structure required
someone could give me the structure of silicon carbide 6H ? please? daniel Quantitative Texture Analysis Internet Course: http://pecdc.univ-lemans.fr/qta/ -- Daniel Chateigner LPEC, UMR-CNRS 06087, Universit du Maine-Le Mans http://pecdc.univ-lemans.fr/lpec.html av. O. Messiaen, BP535 72085 Le Mans cedex Tel prof: 33 (0) 243833268 Fax: 33 (0) 243833518 http://www.univ-lemans.fr/~dchat/danielc/daniel.htm --- --- World Directory of Crystallographers and concerned scientists - fill the form at: http://www.univ-lemans.fr/~dchat/wdc10/state.htm A web-based "Powder Structure Determination" course: http://sdpd.univ-lemans.fr/course/
