Re: Noise in XRD

2016-04-25 Thread Davide Levy
I think you need to close the windows to reduce the Background
On Apr 25, 2016 20:52, "Peter Stephens" 
wrote:

> Use of a chopper won't improve on the limit imposed by shot noise.  You're
> probably better off chasing down the cause of the low angle background.
>
>
> **
> Peter W. Stephens
> Professor, Department of Physics and Astronomy
> Associate Dean for Research and Facilities, College of Arts and Sciences
> Stony Brook University
> (631) 632-8156
> http://mini.physics.sunysb.edu/~pstephens
> Please update your records to my new email: peter.steph...@stonybrook.edu
>
> On Mon, Apr 25, 2016 at 1:02 PM, Shay Tirosh  wrote:
>
>> Thank you all who answered my question.
>>
>> I would like to add in this frame:
>>
>> Are there attempts to use chopping X-ray source coupled to lock-in
>> amplifier to dump noise further?
>> I would use this technique specifically at low angles where the detector
>> tends to saturate with background light.
>>
>> Thanks
>>
>> Shay
>>
>> --
>> _
>>
>> Dr. Shay Tirosh
>> Institute for Nanotechnology & Advanced Materials
>> Bar Ilan University
>> Ramat Gan, 52900
>> Israel
>> Phone: +972-(0)30-531-7320
>> Mobile: +972-(0)54-8834533
>> Email: stiro...@gmail.com
>> _
>>
>> ++
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>> ++
>>
>>
>>
>
>
>
> ++
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> text
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> ++
>
>
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Re: Noise in XRD

2016-04-25 Thread Peter Stephens
Use of a chopper won't improve on the limit imposed by shot noise.  You're
probably better off chasing down the cause of the low angle background.


**
Peter W. Stephens
Professor, Department of Physics and Astronomy
Associate Dean for Research and Facilities, College of Arts and Sciences
Stony Brook University
(631) 632-8156
http://mini.physics.sunysb.edu/~pstephens
Please update your records to my new email: peter.steph...@stonybrook.edu

On Mon, Apr 25, 2016 at 1:02 PM, Shay Tirosh  wrote:

> Thank you all who answered my question.
>
> I would like to add in this frame:
>
> Are there attempts to use chopping X-ray source coupled to lock-in
> amplifier to dump noise further?
> I would use this technique specifically at low angles where the detector
> tends to saturate with background light.
>
> Thanks
>
> Shay
>
> --
> _
>
> Dr. Shay Tirosh
> Institute for Nanotechnology & Advanced Materials
> Bar Ilan University
> Ramat Gan, 52900
> Israel
> Phone: +972-(0)30-531-7320
> Mobile: +972-(0)54-8834533
> Email: stiro...@gmail.com
> _
>
> ++
> Please do NOT attach files to the whole list  >
> Send commands to  eg: HELP as the subject with no body
> text
> The Rietveld_L list archive is on
> http://www.mail-archive.com/rietveld_l@ill.fr/
> ++
>
>
>

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Noise in XRD

2016-04-25 Thread Shay Tirosh
Thank you all who answered my question.

I would like to add in this frame:

Are there attempts to use chopping X-ray source coupled to lock-in
amplifier to dump noise further?
I would use this technique specifically at low angles where the detector
tends to saturate with background light.

Thanks

Shay

-- 
_

Dr. Shay Tirosh
Institute for Nanotechnology & Advanced Materials
Bar Ilan University
Ramat Gan, 52900
Israel
Phone: +972-(0)30-531-7320
Mobile: +972-(0)54-8834533
Email: stiro...@gmail.com
_
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Re: Noise in XRD

2016-04-25 Thread Alan Hewat
You are referring to the different sources of electronic noise
<https://en.wikipedia.org/wiki/Noise_(electronics)> produced by your
detector. Frequency analysis of that noise (white noise vs noise at
particular frequencies) might tell you something about your detector, but
not about your sample. Here I assume you are talking about counting noise,
not background due to imperfect crystallinity or sample environment.

Hopefully most noise in a diffraction pattern will simply be the
statistical noise in counting individual photons or neutrons. With low
counts that will indeed have different distributions; in the background,
with asymmetric Poisson statistics with a cut-off at zero counts, and in
strong peaks, with a transition to a symmetrical normal distribution.
Fitting (smoothing), and especially Rietveld fitting which constrains the
positions and relative intensities of the peaks, will obtain the best
estimate of even weak peaks, provided you have a physically realistic model
for the scattering and not too much correlation between parameters.

For low (neutron) counts, Rietveld assigned weights inversely proportional
to the count, which can be justified by statistics, and which helps prevent
the important information in weak or absent peaks being swamped by the fit
to strong peaks. There have been attempts to shorten scanning time by
spending more time on weak peaks, which are "noisier", but in practice that
is difficult, if as usual you have a multi-detector that collects the whole
pattern at the same time. But weak or absent peaks are indeed more
important than strong peaks.

I am not sure that I have answered your questions, or even if I have
correctly understood them :-) But then you didn't receive many other
answers either.

Alan.

On 24 April 2016 at 19:16, Shay Tirosh  wrote:

> Dear Rietvelders
>
> Does the noise in XRD   tell something?
>
> Correct me if I'm wrong but I think the noise on a peak is different then
> the noise in baseline.
> If this is correct then is there a possibility to identify broad peaks  or
> very small peaks? using some noise analysis.
> Can noise analysis help in better smoothing or fitting?
> Distinguishing between different noise types at baseline vs peak (Shot
> noise, flicker noise <https://en.wikipedia.org/wiki/Flicker_noise> and 
> Johnson–Nyquist
> noise <https://en.wikipedia.org/wiki/Johnson%E2%80%93Nyquist_noise>
> ) may leads to shortening the scanning time, or even to help finding the
> appropriate fitting function.
>
> Please comment
>
> Shay
>
> --
> _
>
> Dr. Shay Tirosh
> Institute for Nanotechnology & Advanced Materials
> Bar Ilan University
> Ramat Gan, 52900
> Israel
> Phone: +972-(0)30-531-7320
> Mobile: +972-(0)54-8834533
> Email: stiro...@gmail.com
> _
>
> ++
> Please do NOT attach files to the whole list  >
> Send commands to  eg: HELP as the subject with no body
> text
> The Rietveld_L list archive is on
> http://www.mail-archive.com/rietveld_l@ill.fr/
> ++
>
>
>


-- 
__
*   Dr Alan Hewat, NeutronOptics, Grenoble, FRANCE *
 +33.476.98.41.68
http://www.NeutronOptics.com/hewat
__
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Noise in XRD

2016-04-24 Thread Shay Tirosh
Dear Rietvelders

Does the noise in XRD   tell something?

Correct me if I'm wrong but I think the noise on a peak is different then
the noise in baseline.
If this is correct then is there a possibility to identify broad peaks  or
very small peaks? using some noise analysis.
Can noise analysis help in better smoothing or fitting?
Distinguishing between different noise types at baseline vs peak (Shot
noise, flicker noise <https://en.wikipedia.org/wiki/Flicker_noise> and
Johnson–Nyquist
noise <https://en.wikipedia.org/wiki/Johnson%E2%80%93Nyquist_noise>  ) may
leads to shortening the scanning time, or even to help finding the
appropriate fitting function.

Please comment

Shay

-- 
_

Dr. Shay Tirosh
Institute for Nanotechnology & Advanced Materials
Bar Ilan University
Ramat Gan, 52900
Israel
Phone: +972-(0)30-531-7320
Mobile: +972-(0)54-8834533
Email: stiro...@gmail.com
_
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