vyovleonid
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From: Alan Hewat
To: Jonathan Wright
Cc: "rietveld_l@ill.fr"
Sent: Friday, August 26, 2016 1:58 PM
Subject: Re: Something to read...
http://www.nature.com/articles /srep31625 on "Full Diffraction Profile Analysis"
I
http://www.nature.com/articles/srep31625 on "Full Diffraction Profile
Analysis"
I like figure 1 and look forward to seeing the method applied to quantify
uncertainty by appropriately
modeling the heteroskedasticity and correlation of the error structure in
something other than silicon.
Alan
_
Probably of interest to several readers here, a new paper on
methodology:
"Use of Bayesian Inference in Crystallographic Structure Refinement via
Full Diffraction Profile Analysis"
Chris M. Fancher, Zhen Han, Igor Levin, Katharine Page, Brian J. Reich,
Ralph C. Smith, Alyson G. Wilson & Jacob
