Intel SSD 2500. not in database. lots of unknown attributes
smartctl 6.4 2015-06-04 r4109 [x86_64-apple-darwin15.0.0] (local build)
Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: INTEL SSDSC2BF480A5
Firmware Version: TG26
User Capacity: 480,103,981,056 bytes [480 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Oct 8 16:45:11 2015 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5860) seconds.
Offline data collection
capabilities: (0x7f) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Abort Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 58) minutes.
Conveyance self-test routine
recommended polling time: ( 4) minutes.
SCT capabilities: (0x0025) SCT Status supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 100 100 000 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 6
170 Unknown_Attribute PO--CK 100 100 010 - 0
171 Unknown_Attribute -O--CK 100 100 000 - 0
172 Unknown_Attribute -O--CK 100 100 000 - 0
174 Unknown_Attribute -O--CK 100 100 000 - 2
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO--CK 100 100 090 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 034 100 000 - 34 (Min/Max 25/36)
192 Power-Off_Retract_Count -O--CK 100 100 000 - 2
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
225 Unknown_SSD_Attribute -O--CK 100 100 000 - 0
226 Unknown_SSD_Attribute -O--CK 100 100 000 - 65535
227 Unknown_SSD_Attribute -O--CK 100 100 000 - 47
228 Power-off_Retract_Count -O--CK 100 100 000 - 65535
232 Available_Reservd_Space PO--CK 100 100 010 - 0
233 Media_Wearout_Indicator -O--CK 100 100 000 - 0
241 Total_LBAs_Written -O--CK 100 100 000 - 0
242 Total_LBAs_Read -O--CK 100 100 000 - 0
249 Unknown_Attribute -O--CK 100 100 000 - 1
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not
implemented
Read GP Log Directory failed
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
0x04 SL R/O 1 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x09 SL R/W 1 Selective self-test log
0x30 SL R/O 16 IDENTIFY DEVICE data log
0x80-0x9f SL R/W 16 Host vendor specific log
0xb7 SL VS 16 Device vendor specific log
0xe0 SL R/W 1 SCT Command/Status
0xe1 SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log not supported
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 0 (0x0000)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 34 Celsius
Power Cycle Min/Max Temperature: 25/36 Celsius
Lifetime Min/Max Temperature: 24/66 Celsius
Under/Over Temperature Limit Count: 0/0
Write SCT Data Table failed: Undefined error: 0
Read SCT Temperature History failed
SCT Error Recovery Control command not supported
Device Statistics (SMART Log 0x04)
Page Offset Size Value Flags Description
ATA_SMART_READ_LOG failed: Undefined error: 0
Read Device Statistics pages 0x00-0x07 failed
ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not
implemented
Read SATA Phy Event Counters failed
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