Toshiba Enterprise SSD HK3R2 480GB not in database
smartctl 6.4 2015-06-04 r4109 [x86_64-linux-4.1.30-std481-amd64] (local build)
Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA THNSNJ480PCSZ
Firmware Version: JZET6102
User Capacity: 480,103,981,056 bytes [480 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Jul 11 21:46:27 2017 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 19) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--- 100 100 050 - 0
5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0
8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0
9 Power_On_Hours -O--C- 100 100 000 - 11
10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
12 Power_Cycle_Count -O--C- 100 100 000 - 3
167 Unknown_Attribute -O---K 100 100 000 - 0
168 Unknown_Attribute -O--C- 100 100 000 - 0
169 Unknown_Attribute PO--C- 100 100 010 - 100
170 Unknown_Attribute PO--C- 100 100 010 - 0
173 Unknown_Attribute -O--C- 200 200 000 - 64253
174 Unknown_Attribute -O--C- 200 200 000 - 61946
175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
192 Power-Off_Retract_Count -O--C- 100 100 000 - 0
194 Temperature_Celsius -O---K 067 064 000 - 33 (Min/Max 26/36)
197 Current_Pending_Sector -O--C- 100 100 000 - 0
232 Available_Reservd_Space -O---K 100 100 000 - 0
240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
241 Total_LBAs_Written -O--C- 100 100 000 - 0
242 Total_LBAs_Read -O--C- 100 100 000 - 0
243 Unknown_Attribute -O--C- 100 100 000 - 0
249 Unknown_Attribute -O---K 100 100 000 - 1587
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 SATA NCQ Queued Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 11 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 3 (0x0003)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 29/36 Celsius
Lifetime Min/Max Temperature: 26/36 Celsius
Under/Over Temperature Limit Count: 0/0
Vendor specific:
00 00 04 00 01 01 00 05 05 00 00 00 00 00 00 00
00 02 00 00 3c 9e 00 00 04 04 00 00 00 00 00 07
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/40 Celsius
Min/Max Temperature Limit: 0/80 Celsius
Temperature History Size (Index): 128 (59)
Index Estimated Time Temperature Celsius
60 2017-07-11 19:39 ? -
... ..( 66 skipped). .. -
127 2017-07-11 20:46 ? -
0 2017-07-11 20:47 28 *********
1 2017-07-11 20:48 ? -
2 2017-07-11 20:49 28 *********
3 2017-07-11 20:50 29 **********
4 2017-07-11 20:51 29 **********
5 2017-07-11 20:52 30 ***********
... ..( 2 skipped). .. ***********
8 2017-07-11 20:55 30 ***********
9 2017-07-11 20:56 31 ************
... ..( 13 skipped). .. ************
23 2017-07-11 21:10 31 ************
24 2017-07-11 21:11 ? -
25 2017-07-11 21:12 30 ***********
26 2017-07-11 21:13 31 ************
... ..( 8 skipped). .. ************
35 2017-07-11 21:22 31 ************
36 2017-07-11 21:23 32 *************
... ..( 17 skipped). .. *************
54 2017-07-11 21:41 32 *************
55 2017-07-11 21:42 34 ***************
56 2017-07-11 21:43 36 *****************
57 2017-07-11 21:44 35 ****************
58 2017-07-11 21:45 34 ***************
59 2017-07-11 21:46 33 **************
SCT Error Recovery Control:
Read: 600 (60.0 seconds)
Write: 600 (60.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 3 --- Lifetime Power-On Resets
0x01 0x018 6 0 --- Logical Sectors Written
0x01 0x020 6 0 --- Number of Write Commands
0x01 0x028 6 20028 --- Logical Sectors Read
0x01 0x030 6 505 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and
Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 33 --- Current Temperature
0x05 0x010 1 - --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 - --- Highest Temperature
0x05 0x028 1 - --- Lowest Temperature
0x05 0x030 1 - --- Highest Average Short Term Temperature
0x05 0x038 1 - --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 40 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 5 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 8 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 5 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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