Re: [PATCH v2] misc: i2c_eeprom: implement different probe test eeprom offset

2020-05-29 Thread Heiko Schocher
Hello Eugen, Am 07.05.2020 um 10:53 schrieb Eugen Hristev: Because of this commit : 5ae84860b0 ("misc: i2c_eeprom: verify that the chip is functional at probe()") at probe time, each eeprom is tested for read at offset 0. The Atmel AT24MAC402 eeprom has different mapping. One i2c slave address

Re: [PATCH v2] misc: i2c_eeprom: implement different probe test eeprom offset

2020-05-27 Thread Eugen.Hristev
On 28.05.2020 06:59, Heiko Schocher wrote: > Hello Eugen, > > Am 07.05.2020 um 17:08 schrieb eugen.hris...@microchip.com: >> On 07.05.2020 18:02, Baruch Siach wrote: >>> Hi Heiko, >>> >>> On Thu, May 07 2020, Heiko Schocher wrote: Am 07.05.2020 um 10:53 schrieb Eugen Hristev: > Because

Re: [PATCH v2] misc: i2c_eeprom: implement different probe test eeprom offset

2020-05-27 Thread Heiko Schocher
Hello Eugen, Am 07.05.2020 um 17:08 schrieb eugen.hris...@microchip.com: On 07.05.2020 18:02, Baruch Siach wrote: Hi Heiko, On Thu, May 07 2020, Heiko Schocher wrote: Am 07.05.2020 um 10:53 schrieb Eugen Hristev: Because of this commit : 5ae84860b0 ("misc: i2c_eeprom: verify that the chip

Re: [PATCH v2] misc: i2c_eeprom: implement different probe test eeprom offset

2020-05-07 Thread Eugen.Hristev
On 07.05.2020 18:02, Baruch Siach wrote: > Hi Heiko, > > On Thu, May 07 2020, Heiko Schocher wrote: >> Am 07.05.2020 um 10:53 schrieb Eugen Hristev: >>> Because of this commit : >>> 5ae84860b0 ("misc: i2c_eeprom: verify that the chip is functional at >>> probe()") >>> at probe time, each eeprom

Re: [PATCH v2] misc: i2c_eeprom: implement different probe test eeprom offset

2020-05-07 Thread Baruch Siach
Hi Heiko, On Thu, May 07 2020, Heiko Schocher wrote: > Am 07.05.2020 um 10:53 schrieb Eugen Hristev: >> Because of this commit : >> 5ae84860b0 ("misc: i2c_eeprom: verify that the chip is functional at >> probe()") >> at probe time, each eeprom is tested for read at offset 0. >> >> The Atmel

Re: [PATCH v2] misc: i2c_eeprom: implement different probe test eeprom offset

2020-05-07 Thread Heiko Schocher
Hello Eugen, Am 07.05.2020 um 10:53 schrieb Eugen Hristev: Because of this commit : 5ae84860b0 ("misc: i2c_eeprom: verify that the chip is functional at probe()") at probe time, each eeprom is tested for read at offset 0. The Atmel AT24MAC402 eeprom has different mapping. One i2c slave address

[PATCH v2] misc: i2c_eeprom: implement different probe test eeprom offset

2020-05-07 Thread Eugen Hristev
Because of this commit : 5ae84860b0 ("misc: i2c_eeprom: verify that the chip is functional at probe()") at probe time, each eeprom is tested for read at offset 0. The Atmel AT24MAC402 eeprom has different mapping. One i2c slave address is used for the lower 0x80 bytes and another i2c slave