[Bug 106006] Re: vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel

2007-11-19 Thread Kees Cook
** Changed in: freeradius (Ubuntu Dapper) Status: In Progress = Triaged ** Changed in: freeradius (Ubuntu Edgy) Status: In Progress = Triaged ** Changed in: freeradius (Ubuntu Feisty) Status: In Progress = Triaged -- vulnerable to memory exhaustion via malformed Diameter

[Bug 106006] Re: vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel

2007-11-19 Thread William Grant
** Changed in: freeradius (Ubuntu Dapper) Status: Triaged = In Progress ** Summary changed: - vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel + CVE-2007-2028: vulnerable to memory exhaustion via malformed Diameter format attributes

[Bug 106006] Re: vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel

2007-11-14 Thread Bug Watch Updater
** Changed in: freeradius (Fedora) Status: Unknown = Fix Released -- vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel https://bugs.launchpad.net/bugs/106006 You received this bug notification because you are a member of Ubuntu Bugs,

[Bug 106006] Re: vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel

2007-11-13 Thread William Grant
I'll get to this within a couple of days - the patch is on the RHEL bug. ** Bug watch added: Red Hat Bugzilla #236247 https://bugzilla.redhat.com/show_bug.cgi?id=236247 ** Also affects: freeradius (Fedora) via https://bugzilla.redhat.com/show_bug.cgi?id=236247 Importance: Unknown

[Bug 106006] Re: vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel

2007-11-13 Thread William Grant
** Changed in: freeradius (Ubuntu) Status: New = Fix Released ** CVE added: http://www.cve.mitre.org/cgi- bin/cvename.cgi?name=2007-2028 -- vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel https://bugs.launchpad.net/bugs/106006 You

[Bug 106006] Re: vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel

2007-04-12 Thread Eddie M.
This bug is a duplicate of bug # 106008 -- vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel https://bugs.launchpad.net/bugs/106006 You received this bug notification because you are a member of Ubuntu Bugs, which is the bug contact for

[Bug 106006] Re: vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel

2007-04-12 Thread Kees Cook
Looks like you typo'd the duplication. 106008 isn't about freeradius. :) -- vulnerable to memory exhaustion via malformed Diameter format attributes inside of an EAP-TTLS tunnel https://bugs.launchpad.net/bugs/106006 You received this bug notification because you are a member of Ubuntu Bugs,