Hello,
Please add disk ST3250310AS to database.
In attachment output from smartctl -a -d 3ware,2 /dev/twa0 right after
competition of both short and long tests.
Regards
Marcin Lubojanski
my_host:~# smartctl -a -d 3ware,2 /dev/twa0
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: ST3250310AS
Serial Number: 6RYBTBZZ
Firmware Version: 3.AAF
User Capacity: 250,059,350,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Wed Sep 2 04:29:22 2009 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 253 006 Pre-fail Always
- 0
3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always
- 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always
- 17
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always
- 0
7 Seek_Error_Rate 0x000f 082 060 030 Pre-fail Always
- 185547741
9 Power_On_Hours 0x0032 094 094 000 Old_age Always
- 5939
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always
- 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always
- 18
187 Unknown_Attribute 0x0032 100 100 000 Old_age Always
- 0
189 Unknown_Attribute 0x003a 100 100 000 Old_age Always
- 0
190 Unknown_Attribute 0x0022 048 045 045 Old_age Always
In_the_past 924254260
194 Temperature_Celsius 0x0022 052 055 000 Old_age Always
- 52 (Lifetime Min/Max 0/23)
195 Hardware_ECC_Recovered 0x001a 060 053 000 Old_age Always
- 240876962
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always
- 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline
- 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always
- 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Extended offline Completed without error 00% 5939 -
# 2 Short offline Completed without error 00% 5938 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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