Samsung SpinPoint P80 SP0401N with firmware TJ100-30 requires -v
9,halfminutes, don't know about -v 198,increasing as there are no
failures but the drive should probably get added here:
{ "SAMSUNG SpinPoint P80", // firmware *-25...34, tested with
SP1614C/SW100-25 and -34
"SAMSUNG SP(0451|08[0124]2|12[0145]3|16[0145]4)[CN]",
".*-(2[5-9]|3[0-4])",
"",
"-v 9,halfminutes -v 198,increasing"
}
root@ubuntu:/home/ubuntu/smartmontools-5.43# ./smartctl -a /dev/sda
smartctl 5.43 2012-06-30 r3573 [i686-linux-2.6.35-22-generic] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SP0401N
Serial Number: S004J10Y92XXXX (redacted for privacy reasons)
Firmware Version: TJ100-30
User Capacity: 40,060,403,712 bytes [40.0 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Mon Jul 2 11:32:01 2012 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1500) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 25) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always
- 0
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always
- 6208
4 Start_Stop_Count 0x0032 094 094 000 Old_age Always
- 6587
5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always
- 0
7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always
- 0
8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline
- 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always
- 367131
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always
- 0
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always
- 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always
- 3341
194 Temperature_Celsius 0x0022 130 085 000 Old_age Always
- 36
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always
- 393373
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always
- 0
200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always
- 0
201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age Always
- 0
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 3057 hours (127 days + 9 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe 00 00 00 40 00 00:01:35.063 SET FEATURES [Enable APM]
ec 00 01 00 00 00 00 00 00:01:34.063 IDENTIFY DEVICE
c8 00 08 00 00 00 e0 00 00:01:33.688 READ DMA
c8 00 08 00 10 00 e0 00 00:01:33.313 READ DMA
c8 00 08 20 00 00 e0 00 00:01:33.313 READ DMA
Error 2 occurred at disk power-on lifetime: 3057 hours (127 days + 9 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe 00 00 00 40 00 00:16:24.625 SET FEATURES [Enable APM]
ec 00 01 00 00 00 00 00 00:16:23.125 IDENTIFY DEVICE
c8 00 08 00 00 00 e0 00 00:16:22.938 READ DMA
c8 00 08 00 10 00 e0 00 00:16:22.438 READ DMA
c8 00 08 20 00 00 e0 00 00:16:22.438 READ DMA
Error 1 occurred at disk power-on lifetime: 3056 hours (127 days + 8 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe 00 00 00 40 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe 00 00 00 40 00 00:12:25.063 SET FEATURES [Enable APM]
ec 00 01 00 00 00 00 00 00:12:23.875 IDENTIFY DEVICE
c8 00 08 00 00 00 e0 00 00:12:23.438 READ DMA
c8 00 08 00 10 00 e0 00 00:12:23.000 READ DMA
c8 00 08 20 00 00 e0 00 00:12:23.000 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 3059 -
# 2 Short offline Completed without error 00% 3047 -
Device does not support Selective Self Tests/Logging
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