Hello List,
please add the drive "SanDisk SDSSDP256G" to your Database.
thx and greets
Markus
smartctl 6.1 2013-03-16 r3800 [x86_64-linux-3.9.11-200.fc18.x86_64] (local
build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SanDisk SDSSDP256G
Serial Number: 123507400106
LU WWN Device Id: 5 001b44 7cd3259aa
Firmware Version: 2.0.0
User Capacity: 256.060.514.304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Wed Jul 24 21:58:47 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 24) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O---- 100 100 000 - 0
9 Power_On_Hours -O---- 100 100 000 - 440
12 Power_Cycle_Count -O---- 100 100 000 - 186
171 Unknown_Attribute -O---- 100 100 000 - 0
172 Unknown_Attribute -O---- 100 100 000 - 0
173 Unknown_Attribute -O---- 100 100 000 - 1
174 Unknown_Attribute -O---- 100 100 000 - 21
187 Reported_Uncorrect -O---- 100 100 000 - 0
230 Unknown_SSD_Attribute -O---- 100 100 000 - 3
232 Available_Reservd_Space PO---- 100 100 005 - 0
234 Unknown_Attribute -O---- 100 100 000 - 14
241 Total_LBAs_Written -O---- 100 100 000 - 569168275
242 Total_LBAs_Read -O---- 100 100 000 - 485422115
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 1 Device vendor specific log
0xa2 GPL,SL VS 2 Device vendor specific log
0xa3 GPL,SL VS 1 Device vendor specific log
Warning! SMART Extended Comprehensive Error Log Structure (16/16) error:
invalid SMART checksum.
SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
No Errors Logged
SMART Extended Self-test Log (GP Log 0x07) not supported
Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 440 -
# 2 Short offline Aborted by host 90% 440 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 31 Current Temperature
5 0x010 1 - Average Short Term Temperature
5 0x018 1 - Average Long Term Temperature
5 0x020 1 47 Highest Temperature
5 0x028 1 22 Lowest Temperature
5 0x030 1 - Highest Average Short Term Temperature
5 0x038 1 - Lowest Average Short Term Temperature
5 0x040 1 - Highest Average Long Term Temperature
5 0x048 1 - Lowest Average Long Term Temperature
5 0x050 4 0 Time in Over-Temperature
5 0x058 1 95 Specified Maximum Operating Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 0~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 9 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0001 2 0 Command failed due to ICRC error
------------------------------------------------------------------------------
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