Attached is the smartctl -q noserial -x output for a Micron C400 SED
(MTFDDAK256MAM-1K12) drive.
http://www.micron.com/parts/solid-state-storage/ssd/mtfddak256mam-1k12
http://www.micron.com/products/datasheets/82a41af7-e5ae-4643-abbd-ff66a0bf175e
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.6-200.fc20.x86_64] (local
build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MTFDDAK256MAM-1K12
Firmware Version: 08TH
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Mar 26 20:43:37 2014 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 0 (reserved)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1190) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 19) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 15
12 Power_Cycle_Count -O--CK 100 100 000 - 63
170 Unknown_Attribute PO--CK 100 100 010 - 0
171 Unknown_Attribute -O--CK 100 100 000 - 0
172 Unknown_Attribute -O--CK 100 100 000 - 0
173 Unknown_Attribute PO--CK 100 100 010 - 1
174 Unknown_Attribute -O--CK 100 100 000 - 45
181 Program_Fail_Cnt_Total -O---K 100 100 000 - 150324772884
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
189 Unknown_SSD_Attribute -OSR-- 100 100 000 - 94
194 Temperature_Celsius -O---K 100 100 000 - 0
195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 0
202 Unknown_SSD_Attribute ---RC- 100 100 000 - 0
206 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 255 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x80-0x83 SL R/W 1 Host vendor specific log
0x84-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 2000 Device vendor specific log
0xa0 SL VS 208 Device vendor specific log
0xa1-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log size 16383 not supported
SMART Error Log Version: 1
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 15 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 0 Celsius
Power Cycle Max Temperature: 0 Celsius
Lifetime Max Temperature: 0 Celsius
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (82)
Index Estimated Time Temperature Celsius
83 2014-03-23 13:10 ? -
... ..(399 skipped). .. -
5 2014-03-26 07:50 ? -
6 2014-03-26 08:00 0 -
7 2014-03-26 08:10 ? -
... ..( 56 skipped). .. -
64 2014-03-26 17:40 ? -
65 2014-03-26 17:50 0 -
... ..( 16 skipped). .. -
82 2014-03-26 20:40 0 -
SCT Error Recovery Control:
Read: 40 (4.0 seconds)
Write: 40 (4.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 2) ==
1 0x008 4 63 Lifetime Power-On Resets
1 0x010 4 15 Power-on Hours
1 0x018 6 555783370 Logical Sectors Written
1 0x020 6 5232520 Number of Write Commands
1 0x028 6 576247105 Logical Sectors Read
1 0x030 6 12769749 Number of Read Commands
4 ===== = = == General Errors Statistics (rev 1) ==
4 0x008 4 0 Number of Reported Uncorrectable Errors
4 0x010 4 0 Resets Between Cmd Acceptance and Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 0 Current Temperature
5 0x010 1 - Average Short Term Temperature
5 0x018 1 - Average Long Term Temperature
5 0x020 1 0 Highest Temperature
5 0x028 1 0 Lowest Temperature
5 0x030 1 - Highest Average Short Term Temperature
5 0x038 1 - Lowest Average Short Term Temperature
5 0x040 1 - Highest Average Long Term Temperature
5 0x048 1 - Lowest Average Long Term Temperature
5 0x050 4 - Time in Over-Temperature
5 0x058 1 70 Specified Maximum Operating Temperature
5 0x060 4 - Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 0 Number of Hardware Resets
6 0x010 4 0 Number of ASR Events
6 0x018 4 0 Number of Interface CRC Errors
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 6~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 18 Device-to-host register FISes sent due to a COMRESET
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