Hi,

I do not know how you guys handle additions to the database but I just
discovered one unsupported USB Harddrive in the list.

Below is the patch which made it work. Enclosed in the scissors
(----8<----) markers:

----8<----
Index: drivedb.h
===================================================================
--- drivedb.h   (Revision 3983)
+++ drivedb.h   (Arbeitskopie)
@@ -3949,6 +3949,12 @@
     "",
     "-d sat"
   },
+  { "USB: Toshiba Store.E Canvio; ", // USB 3.0
+    "0x0480:0xd000",
+    "", // 0x0100
+    "",
+    "-d sat"
+  },
 /*
 }; // builtin_knowndrives[]
  */
----8<----

[1] is the output from the smartctl /dev/sdd -a after compiling this.

If there is a more convenient way for you to handle this change (e.g. a git
formatted patch, ...) or if there is any information missing please let me
know.  BTW, I am not subscribed so please CC me in answers.

Cheers Heiko

[1]

smartctl 6.4 2014-08-16 r3983 [i686-linux-3.13.0-34-generic] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     TOSHIBA DT01ABA300
Serial Number:    64B1MSXGS
LU WWN Device Id: 5 000039 ff4dced99
Firmware Version: MZ6OABB0
User Capacity:    3.000.592.982.016 bytes [3,00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5940 rpm
Form Factor:      3.5 inches
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ATA8-ACS T13/1699-D revision 4
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Sun Aug 17 16:54:21 2014 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x80) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      ( 249) Self-test routine in progress...
                                        90% of test remaining.
Total time to complete Offline 
data collection:                (26455) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off 
support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine 
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        ( 441) minutes.
SCT capabilities:              (0x003d) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  
WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   016    Pre-fail  Always       
-       0
  2 Throughput_Performance  0x0005   100   100   054    Pre-fail  Offline      
-       0
  3 Spin_Up_Time            0x0007   135   135   024    Pre-fail  Always       
-       397 (Average 413)
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       
-       16
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       
-       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       
-       0
  8 Seek_Time_Performance   0x0005   100   100   020    Pre-fail  Offline      
-       0
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       
-       18
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       
-       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       
-       16
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       
-       17
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       
-       17
194 Temperature_Celsius     0x0002   130   130   000    Old_age   Always       
-       46 (Min/Max 21/48)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       
-       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       
-       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      
-       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       
-       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.


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