I ended up with a Samsung SV843 that has HP firmware, and reports the
smart data slightly differently than the normal Samsung firmware does.
I suspect attribute 173 is wear leveling count, and 202 is percentage
of rated life used, while the rest is reported correctly.
Output of smartctl -x is attached.
--
All rights reversed.
smartctl 6.2 2014-07-16 r3952 [x86_64-linux-3.18.7-200.fc21.x86_64] (local
build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MK0960GECQK
Serial Number: S1JANYAG101591
LU WWN Device Id: 5 002538 500258136
Firmware Version: HPG0
User Capacity: 960,197,124,096 bytes [960 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Apr 14 10:34:23 2015 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Unavailable
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 200 200 002 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
9 Power_On_Hours -O--CK 099 099 000 - 10
173 Unknown_Attribute PO--CK 099 099 005 - 7
175 Program_Fail_Count_Chip PO--CK 100 100 001 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO-RCK 100 100 097 - 0
194 Temperature_Celsius -O---K 065 062 000 - 35
196 Reallocated_Event_Count PO--CK 100 100 005 - 0
202 Unknown_SSD_Attribute PO--CK 100 100 010 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 1 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
0xb6 GPL,SL VS 1 Device vendor specific log
0xd0 GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 10 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 35 Celsius
Power Cycle Min/Max Temperature: 26/37 Celsius
Lifetime Min/Max Temperature: 26/37 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/55 Celsius
Min/Max Temperature Limit: 0/55 Celsius
Temperature History Size (Index): 128 (60)
Index Estimated Time Temperature Celsius
61 2015-04-14 08:27 ? -
... ..( 65 skipped). .. -
127 2015-04-14 09:33 ? -
0 2015-04-14 09:34 26 *******
1 2015-04-14 09:35 33 **************
2 2015-04-14 09:36 34 ***************
... ..( 3 skipped). .. ***************
6 2015-04-14 09:40 34 ***************
7 2015-04-14 09:41 35 ****************
8 2015-04-14 09:42 35 ****************
9 2015-04-14 09:43 37 ******************
10 2015-04-14 09:44 36 *****************
... ..( 8 skipped). .. *****************
19 2015-04-14 09:53 36 *****************
20 2015-04-14 09:54 35 ****************
... ..( 39 skipped). .. ****************
60 2015-04-14 10:34 35 ****************
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 2) ==
1 0x008 4 3 Lifetime Power-On Resets
1 0x010 4 10 Power-on Hours
1 0x018 6 113639255 Logical Sectors Written
1 0x020 6 42012647 Number of Write Commands
1 0x028 6 8519456 Logical Sectors Read
1 0x030 6 30146255 Number of Read Commands
1 0x038 6 36000000 Date and Time TimeStamp
4 ===== = = == General Errors Statistics (rev 1) ==
4 0x008 4 0 Number of Reported Uncorrectable Errors
4 0x010 4 0 Resets Between Cmd Acceptance and Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 35 Current Temperature
5 0x020 1 39 Highest Temperature
5 0x028 1 26 Lowest Temperature
5 0x058 1 55 Specified Maximum Operating Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 0 Number of Hardware Resets
6 0x010 4 0 Number of ASR Events
6 0x018 4 0 Number of Interface CRC Errors
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 1~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 20 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 84 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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