Hi ,
It seems the drive "Device Model: LITEON IT EBE-200NAS" we are using is not
in smartdb
Please find attached the output of smartctl -q noserial -x /dev/sdX and please
let me know if you need more info
Thanks
Lakshmi
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.10.07] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: LITEON IT EBE-200NAS
Firmware Version: LPBE11XK
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Oct 5 21:11:17 2015 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Disabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 10) seconds.
Offline data collection
capabilities: (0x1d) SMART execute Offline immediate.
No Auto Offline data collection support.
Abort Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x00) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O---- 100 100 070 - 0
5 Reallocated_Sector_Ct PO---- 100 100 000 - 0
9 Power_On_Hours -O---- 100 100 000 - 1088
12 Power_Cycle_Count -O---- 100 100 000 - 36
13 Read_Soft_Error_Rate -O---- 100 100 000 - 0
175 Program_Fail_Count_Chip PO---- 100 100 000 - 0
176 Erase_Fail_Count_Chip PO---- 100 100 000 - 0
177 Wear_Leveling_Count PO---- 100 100 000 - 1231
178 Used_Rsvd_Blk_Cnt_Chip PO---- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO---- 100 100 000 - 0
180 Unused_Rsvd_Blk_Cnt_Tot -O---- 100 100 005 - 7712
181 Program_Fail_Cnt_Total -O---- 100 100 000 - 0
182 Erase_Fail_Count_Total -O---- 100 100 000 - 0
194 Temperature_Celsius -O---- 100 100 000 - 47
195 Hardware_ECC_Recovered -O---- 100 100 000 - 0
198 Offline_Uncorrectable -O---- 100 100 000 - 0
199 UDMA_CRC_Error_Count -O---- 100 100 000 - 0
201 Unknown_SSD_Attribute PO---- 100 100 000 - 0
202 Unknown_SSD_Attribute PO---- 100 100 000 - 0
232 Available_Reservd_Space PO---- 100 000 010 Past 100
233 Media_Wearout_Indicator -O---- 100 100 000 - 15001
241 Total_LBAs_Written PO---- 100 100 000 - 15001
242 Total_LBAs_Read PO---- 100 100 000 - 44152
245 Unknown_Attribute -O---- 096 000 010 Past 96
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 8 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 4096 -
# 2 Extended offline Completed without error 00% 4096 -
Selective Self-tests/Logging not supported
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 47 Celsius
Power Cycle Min/Max Temperature: 42/53 Celsius
Lifetime Min/Max Temperature: 33/64 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/70 Celsius
Min/Max Temperature Limit: 0/75 Celsius
Temperature History Size (Index): 128 (44)
Index Estimated Time Temperature Celsius
45 2015-10-05 19:04 47 ****************************
... ..(126 skipped). .. ****************************
44 2015-10-05 21:11 47 ****************************
SCT Error Recovery Control:
Read: 80 (8.0 seconds)
Write: 80 (8.0 seconds)
Device Statistics (GP Log 0x04) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x000a 2 126 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
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