I have several 4801 and one 5501 with 2.5" user grade disk inside. On a disk that is mounted together with an Atheros minipci wifi board in a 4801, that is just between the motherboard and the disk, I start notice many hw error.
Unable to replace the disk, I simply unplug the minipci board and the disk start working flawlessy. So I have a lot of question.... Is the disk that gave errors to be replaced anyway? The Soekris interfaces placement that make the minipci heat the disk is to be blamed? The "worst" walue I read the temperature using smartmon is the historical lifetime one or is the max one after the last power cycle? ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 194 Temperature_Celsius 0x0022 050 059 000 Old_age Always - 50 Why this second disk smartmon line show different temperature in raw and value columns? the raw value seems reasonable and the VALUE value seems not reasonable. D# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 194 Temperature_Celsius 0x0022 082 073 000 Old_age Always - 52 What are a "normal range" of temperatures? Attached the two complete smartmon listing, just in case. Many thanks. Marco -- + Marco A. Calamari [EMAIL PROTECTED] www.marcoc.it --------+ | PGP RSA: ED84 3839 6C4D 3FFE 389F 209E 3128 5698 | | DSS/DH: 8F3E 5BAE 906F B416 9242 1C10 8661 24A9 BFCE 822B | + P.E.C.: [EMAIL PROTECTED] ---------------------+
smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: ST94019A Serial Number: 3KW5P55X Firmware Version: 3.05 Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2 Local Time is: Sun Aug 31 15:33:57 2008 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 426) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 31) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 050 047 034 Pre-fail Always - 23905753 3 Spin_Up_Time 0x0003 099 099 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 12 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 355683515 9 Power_On_Hours 0x0032 070 070 000 Old_age Always - 26968 10 Spin_Retry_Count 0x0013 100 100 034 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 316 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1347 193 Load_Cycle_Count 0x0032 001 001 000 Old_age Always - 1482999 194 Temperature_Celsius 0x0022 050 059 000 Old_age Always - 50 195 Hardware_ECC_Recovered 0x001a 050 047 000 Old_age Always - 23905753 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 69 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 69 occurred at disk power-on lifetime: 26793 hours (1116 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 5f 77 df f0 Error: UNC 1 sectors at LBA = 0x00df775f = 14645087 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 58 77 df f0 00 00:32:04.024 READ DMA EXT 25 00 08 70 bc d9 f0 00 00:32:04.023 READ DMA EXT 25 00 08 80 f6 98 f0 00 00:32:04.022 READ DMA EXT 35 00 08 88 b3 e1 f0 00 00:32:04.021 WRITE DMA EXT 35 00 10 28 0c 9a f0 00 00:31:51.989 WRITE DMA EXT Error 68 occurred at disk power-on lifetime: 26793 hours (1116 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 5f 77 df f0 Error: UNC 1 sectors at LBA = 0x00df775f = 14645087 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 58 77 df f0 00 00:31:26.708 READ DMA EXT 25 00 08 78 36 e6 f0 00 00:31:21.349 READ DMA EXT 25 00 08 58 77 df f0 00 00:31:21.335 READ DMA EXT 35 00 08 ff f7 2a f0 00 00:31:21.335 WRITE DMA EXT 35 00 08 67 41 00 f0 00 00:31:51.989 WRITE DMA EXT Error 67 occurred at disk power-on lifetime: 26793 hours (1116 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 04 5c 77 df f0 Error: UNC 4 sectors at LBA = 0x00df775c = 14645084 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 58 77 df f0 00 00:31:26.708 READ DMA EXT 35 00 08 ff f7 2a f0 00 00:31:21.349 WRITE DMA EXT 35 00 08 67 41 00 f0 00 00:31:21.335 WRITE DMA EXT 35 00 08 40 70 99 f0 00 00:31:21.335 WRITE DMA EXT 25 00 08 58 77 df f0 00 00:31:21.334 READ DMA EXT Error 66 occurred at disk power-on lifetime: 26793 hours (1116 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 05 5b 77 df f0 Error: UNC 5 sectors at LBA = 0x00df775b = 14645083 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 58 77 df f0 00 00:31:26.708 READ DMA EXT 25 00 08 b0 09 dd f0 00 00:31:21.349 READ DMA EXT 25 00 08 30 0c 9a f0 00 00:31:21.335 READ DMA EXT 25 00 08 58 77 df f0 00 00:31:21.335 READ DMA EXT 35 00 28 3f 41 00 f0 00 00:31:21.334 WRITE DMA EXT Error 65 occurred at disk power-on lifetime: 26793 hours (1116 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 05 5b 77 df f0 Error: UNC 5 sectors at LBA = 0x00df775b = 14645083 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 58 77 df f0 00 00:31:26.708 READ DMA EXT 35 00 28 3f 41 00 f0 00 00:31:21.349 WRITE DMA EXT 35 00 18 28 70 99 f0 00 00:31:21.335 WRITE DMA EXT 25 00 08 58 77 df f0 00 00:31:21.335 READ DMA EXT 25 00 08 28 0c 9a f0 00 00:31:21.334 READ DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 26860 - # 2 Extended offline Completed without error 00% 26807 - # 3 Extended offline Completed without error 00% 26805 - # 4 Short offline Completed without error 00% 26805 - # 5 Extended offline Aborted by host 40% 26804 - # 6 Extended offline Completed without error 00% 26796 - # 7 Short offline Completed without error 00% 26795 - # 8 Short offline Completed: read failure 90% 26791 14645083 # 9 Extended offline Completed: read failure 80% 26787 14645083 #10 Short offline Completed: read failure 90% 26784 14645083 #11 Short offline Completed: read failure 90% 26784 14645083 #12 Short offline Completed: read failure 90% 26784 14645083 #13 Extended offline Completed: read failure 80% 26774 14645082 #14 Extended offline Completed: read failure 80% 26774 14645076 #15 Short offline Completed without error 00% 26774 - #16 Extended offline Completed without error 00% 22661 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG MP0402H Serial Number: S03WJ10A188117 Firmware Version: UC200-16 User Capacity: 40,060,403,712 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Sun Aug 31 15:37:32 2008 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (2400) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 40) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 18 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 0 5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always - 0 7 Seek_Error_Rate 0x000e 100 100 000 Old_age Always - 0 8 Seek_Time_Performance 0x0024 100 100 000 Old_age Offline - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 758383 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 0 191 G-Sense_Error_Rate 0x0012 100 100 000 Old_age Always - 668 194 Temperature_Celsius 0x0022 082 073 000 Old_age Always - 52 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 172744460 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x0012 100 100 000 Old_age Always - 0 223 Load_Retry_Count 0x0012 100 100 000 Old_age Always - 72 225 Load_Cycle_Count 0x0012 001 001 000 Old_age Always - 1868689 255 Unknown_Attribute 0x000a 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 6147 hours (256 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 51 00 00 4f c2 f0 Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 da 00 00 4f c2 f0 00 23d+00:20:33.971 SMART RETURN STATUS ec 00 00 c7 72 9a f0 00 23d+00:20:33.971 IDENTIFY DEVICE ef 02 00 00 00 00 f0 00 00:00:46.500 SET FEATURES [Enable write cache] 10 00 3f 00 00 00 f0 00 00:00:45.938 RECALIBRATE [OBS-4] 91 00 3f 3f ff 3f f0 00 00:00:45.938 INITIALIZE DEVICE PARAMETERS [OBS-6] SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 6176 - # 2 Short offline Completed without error 00% 6175 - # 3 Extended offline Completed without error 00% 6147 - SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
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