Ashish,
Since
this is a Tech Preview a manual test will suffice. Eventually an automated test
case for a faster turnaround is needed.
Thanks,
Guru
From:
[EMAIL PROTECTED]
[mailto:[EMAIL PROTECTED] On Behalf Of Ashish Patel
Sent: Monday, October 23, 2006
6:16 PM
To: TPTP
Tracing and Profiling Tools Project developer discussions
Subject: RE:
[tptp-tracing-profiling-tools-dev] ARM defect approval
What type of test case are you referring to? The
ARM probes do not have a "TPTP" test case. There are lots of
moving parts - ie. app server, instrumentation of a jar, data collection etc.. Matt
and I have been testing them in Tomcat and WAS using the static and dynamic
workflow manually.
How
would you write an appropriate test case for this? Perhaps we write
manual testing instructions that are repeated for every probe, since we can't
automate this process.
I
currently do not have enough resource to write and run test cases. If we
have time in 4.3i3, I will try getting to this - its already on my todo list.
Thanks,
Ashish Patel
Lead Developer for IBM Performance Optimization Toolkit (IPOT)
Lead Eclipse Committer for ARM
IBM Toronto Lab
tel: (905) 413-3867 | t/l: 969-3867 | fax: (905) 413-4850
[EMAIL PROTECTED]
|
"Nagarajan, Guru"
<[EMAIL PROTECTED]>
Sent
by: [EMAIL PROTECTED]
23/10/2006 08:13 PM
|
Please
respond to
TPTP Tracing and Profiling Tools Project developer
discussions <tptp-tracing-profiling-tools-dev@eclipse.org>
|
|
|
To
|
"TPTP Tracing
and Profiling Tools Project developer discussions"
<tptp-tracing-profiling-tools-dev@eclipse.org>
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cc
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Subject
|
RE: [tptp-tracing-profiling-tools-dev] ARM
defect approval
|
|
Ashish,
Are both these bugs consuming product requirements?
On 162009 – Since this was found in the 4.2.1 stream -
the Test case needs to be updated as well. Do you have an time estimate to
resolve this and the test case?
Thanks,
Guru
From:
[EMAIL PROTECTED]
[mailto:[EMAIL PROTECTED] On Behalf Of Ashish Patel
Sent: Monday, October 23, 2006 4:14 PM
To: tptp-tracing-profiling-tools-dev@eclipse.org
Subject: [tptp-tracing-profiling-tools-dev] ARM defect approval
Found two more bugs in 4.2.1 that need to be fixed in 4.3.
162009 - Servlet context values are incorrectly matched with their context
names.
162010 - prevents operation of EJB monitoring on IBM WAS 5
Requesting approval. These defects only affect the ARM probes - no other
part of TPTP is affected.
Thanks,
Ashish Patel
Lead Developer for IBM Performance Optimization Toolkit (IPOT)
Lead Eclipse Committer for ARM
IBM Toronto Lab
tel: (905) 413-3867 | t/l: 969-3867 | fax: (905) 413-4850
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